Exploració per autor "Balado Suárez, Luz María"
Ara es mostren els items 1-20 de 22
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An Efficient behavioral description frontend tool for mixed-mode SPICE simulation
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan; Chatterjee, Abhijit (2014)
Text en actes de congrés
Accés obert -
Analog circuit test based on a digital signature
Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2010)
Text en actes de congrés
Accés obertProduction verification of analog circuit specifica- tions is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost on-chip parameter verification ... -
Analog circuits testing using digitally coded indirect measurements
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
Text en actes de congrés
Accés restringit per política de l'editorialTesting mixed-signal circuits is a challenging task requiring high amounts of human and technical resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform ... -
Apunts Electrònica ETSEIB
Busquets Monge, Sergio; Lupón Roses, Emilio; Lamaison Urioste, Rafael; Carrasco, Juan A.; Balado Suárez, Luz María; Gómez Pau, Álvaro; Manich Bou, Salvador; Santos Miranda, José Antonio; Moreno Eguilaz, Juan Manuel (Universitat Politècnica de Catalunya, 2022-09-06)
Apunts
Accés obert -
Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.
Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2012)
Text en actes de congrés
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Criteria for indirect measurements in M-S testing
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
Text en actes de congrés
Accés restringit per decisió de l'autorAnalog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog ... -
Criteria for selecting a subset of indirect measurements for analog testing
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2016)
Text en actes de congrés
Accés restringit per política de l'editorialThis work proposes a criterion to select a subset of indirect measurements avoiding redundant information. The key idea of the proposal is to reduce the actual number of measurements to be performed to those strictly ... -
Digital signature generator for mixed-signal testing
Sanahuja Moliner, Ricard; Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2009)
Text en actes de congrés
Accés obertEs presenta un nou generador de signatures digitals per controlar dues senyals anàlogues. Es presenta la tecnologia STM 65 nm per demostrar la viabilitat de la proposta. -
Efficient production binning using octree tessellation in the alternate measurements space
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2015)
Article
Accés obertBinning after volume production is a widely accepted technique to classify fabricated ICs into different clusters depending on different degrees of specification compliance. This allows the manufacturer to sell non optimal ... -
Evaluación de los protocolos de acceso al medio CSMA/CD (acceso multiple con escuha de canal y detección de colisión) y paso de testigo, en redes locales con topologia bus
Balado Suárez, Luz María (Universitat Politècnica de Catalunya, 1987-01-30)
Tesi
Accés obertEl objetivo de la tesis es crear una herramienta de evaluación de prestaciones de redes de área local a nivel MAC para los mecanismos de acceso múltiple aleatorio y con control mediante paso de testigo. <br/>La metodología ... -
Identification of component deviations in analog circuits using digital signatures
Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2011)
Text en actes de congrés
Accés restringit per política de l'editorialAnalog circuits component diagnosis is a challenging task requiring expensive resources. This paper presents a low cost method to identify deviations in multiple component values using a precharacterisation of the impact ... -
Improving indirect test efficiency using multi-directional tessellations in the measure space
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2016)
Text en actes de congrés
Accés restringit per política de l'editorialIndirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever increasing device verification costs. This work explores the ... -
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures
Gómez Pau, Álvaro; Lupón Roses, Emilio; Balado Suárez, Luz María; Figueras, Joan (2020-08-01)
Article
Accés obertAlternate testing techniques have been progressively adopted as a promising solution due to their effectiveness against classical specification-based test methods. This work presents a built-in test system, which adaptively ... -
Indirect test of M-S circuits using multiple specification band guarding
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2016-09-01)
Article
Accés obertTesting analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ... -
M-S test based on specification validation using octrees in the measure space
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
Text en actes de congrés
Accés restringit per política de l'editorialTesting M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy ... -
Mixed-signal test band guarding using digitally coded indirect measurements
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
Text en actes de congrés
Accés restringit per política de l'editorialTesting analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ... -
Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2017-02-20)
Article
Accés restringit per política de l'editorialOne of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers ... -
Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
Text en actes de congrés
Accés restringit per política de l'editorialMicroelectromechanical systems production is still an immature technology compared to the classical semiconductor industry. MEMS fabrication and packaging processes may present misalignments which result in an improper ... -
Quality metrics for mixed-signal indirect testing
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
Text en actes de congrés
Accés obert -
Test of dual axis accelerometers based on specifications compliance
Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Universidad de Navarra, 2013)
Text en actes de congrés
Accés obert