• Built-In Sensor for Signal Integrity Faults in Digital Interconnect Signals 

    Champac Vilela, Víctor Hugo; Avendaño, Victor; Figueras Pàmies, Joan (2010-02)
    Accés obert
    Testing of signal integrity (SI) in current high-speed ICs, requires automatic test equipment test resources at the multigigahertz range, normally not available. Furthermore, for most internal nets of state-of-the-art ...