Now showing items 1-16 of 16

  • A 75 pJ/bit All-Digital Quadrature Coherent IR-UWB Transceiver in 0.18 um CMOS 

    Barajas Ojeda, Enrique; Gómez Salinas, Dídac; Mateo Peña, Diego; González Jiménez, José Luis (2010-05-23)
    Conference report
    Open Access
    In this paper a 75 pJ/b all-digital quadrature coherent impulse radio ultra-wideband transceiver in 0.18 μm CMOS is presented. It consumes 42 mW operating at a 560 Mbps datarate. The receiver and transmitter share most ...
  • Analysis of body bias and RTN-induced frequency shift of low voltage ring oscillators in FDSOI technology 

    Barajas Ojeda, Enrique; Aragonès Cervera, Xavier; Mateo Peña, Diego; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Martin Martínez, Javier; Rodríguez Martínez, Rosana; Porti Pujal, Marc; Nafria, M.; Castro López, Rafael; Roca Moreno, Elisenda; Fernandez, Francisco V. (Institute of Electrical and Electronics Engineers (IEEE), 2018)
    Conference report
    Restricted access - publisher's policy
    Electronic circuits powered at ultra low voltages (500 mV and below) are desirable for their low energy and power consumption. However, RTN (Random Telegraph Noise)-induced threshold voltage variations become very significant ...
  • A self-calibrating closed loop circuit for configurable constant voltage thermal anemometers 

    Gorreta Mariné, Sergio; Barajas Ojeda, Enrique; Kowalski, Lukasz; Atienza García, María Teresa; Domínguez Pumar, Manuel; Jiménez Serres, Vicente (Institution of Electrical Engineers, 2015-09-17)
    Article
    Open Access
  • A versatile CMOS transistor array IC for the statistical characterization of time-zero variability, RTN, BTI, and HCI 

    Diaz Fortuny, Javier; Martin Martínez, Javier; Rodríguez Martínez, Rosana; Castro López, Rafael; Roca Moreno, Elisenda; Aragonès Cervera, Xavier; Barajas Ojeda, Enrique; Mateo Peña, Diego; Fernández Fernández, Francisco V.; Nafría Maqueda, Montserrat (2018-01-01)
    Article
    Open Access
    Statistical characterization of CMOS transistor variability phenomena in modern nanometer technologies is key for accurate end-of-life prediction. This paper presents a novel CMOS transistor array chip to statistically ...
  • Behavioural modelling of DLLs for fast simulation and optimisation of jitter and power consumption 

    Barajas Ojeda, Enrique; Mateo Peña, Diego; González Jiménez, José Luis (IEEE Computer Society Publications, 2010)
    Conference report
    Open Access
    This paper presents a behavioural model for fast DLL simulations. The behavioural model includes a modelling of the various noise sources in the DLL that produce output jitter. The model is used to obtain the dependence ...
  • Design of a broadband CMOS RF power amplifier to establish device-circuit aging correlations 

    Barajas Ojeda, Enrique; Mateo Peña, Diego; Aragonès Cervera, Xavier; Crespo Yepes, Albert; Rodríguez Martínez, Rosana; Martin Martínez, Javier; Nafría Maqueda, Montserrat (Institute of Electrical and Electronics Engineers (IEEE), 2017)
    Conference report
    Restricted access - publisher's policy
    This paper presents the design of a Broadband CMOS RF Power Amplifier, suitable to be stressed at circuit level but with the possibility to be measured both at circuit and at device level. It allows establishing a relation ...
  • DLL's behavioral modeling for power consumption and jitter fast optimization 

    Barajas Ojeda, Enrique; Mateo Peña, Diego; González Jiménez, José Luis (2010)
    Conference report
    Open Access
    This paper analyzes the sources of jitter in a DLL and presents a behavioral model for fast DLL optimization. An algorithm to simulate the DLL in open loop is demonstrated. This procedure, together with the behavioral ...
  • Fast time-to-market with via-configurable transistor array regular fabric: A delay-locked loop design case study 

    González Colás, Antonio María; Pons Solé, Marc; Barajas Ojeda, Enrique; Mateo Peña, Diego; López González, Juan Miguel; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Abella Ferrer, Jaume; Vera Rivera, Francisco Javier (IEEE Computer Society Publications, 2011)
    Conference lecture
    Restricted access - publisher's policy
    Time-to-market is a critical issue for nowadays integrated circuits manufacturers. In this paper the Via-Configurable Transistor Array regular layout fabric (VCTA), which aims to minimize the time-to-market and its associated ...
  • Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches 

    Pouyan, Peyman; Amat Bertran, Esteve; Barajas Ojeda, Enrique; Rubio Sola, Jose Antonio (2014)
    Conference report
    Open Access
    This work presents a test and measurement technique to monitor aging and process variation status of SRAM cells as an aging-aware design technique. We have then verified our technique with an implemented chip. The obtained ...
  • MOSFET degradation dependence on input signal power in a RF power amplifier 

    Crespo Yepes, Albert; Barajas Ojeda, Enrique; Martin Martínez, Javier; Mateo Peña, Diego; Aragonès Cervera, Xavier; Rodríguez Martínez, Rosana; Nafría Maqueda, Montserrat (2017-06-25)
    Article
    Open Access
    Aging produced by RF stress is experimentally analyzed on a RF CMOS power amplifier (PA), as a function of the stress power level. The selected circuit topology allows observing individual NMOS and PMOS transistors ...
  • MOSFET dynamic thermal sensor for IC testing applications 

    Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Barajas Ojeda, Enrique; León, Javier; Vellvehi, Miquel; Jordà, Xavier; Altet Sanahujes, Josep (2016-05-01)
    Article
    Open Access
    This paper analyses how a single metal-oxide-semiconductor field-effect transistor (MOSFET) can be employed as a thermal sensor to measure on-chip dynamic thermal signals caused by a power-dissipating circuit under test ...
  • Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging 

    Perpinyà, Xavier; Reverter Cubarsí, Ferran; León, Javier; Barajas Ojeda, Enrique; Vellvehi, Miquel; Jordà, Xavier; Altet Sanahujes, Josep (2018-01-01)
    Article
    Open Access
    The viability of using off-chip single-shot imaging techniques for local thermal testing in integrated Radio Frequency (RF) power amplifiers (PA’s) is analyzed. With this approach, the frequency response of the output power ...
  • Providing an UWB-IR BAN wireless communications network and its application to design a low power transceiver in CMOS technology 

    Barajas Ojeda, Enrique; Mateo Peña, Diego; González Jiménez, José Luis (Universitat Politècnica de Catalunya, 2010)
    Conference report
    Open Access
    Ultra Wide-Band (UWB) communication techniques have received increasing attention since United States Federal Communications Commission (FCC) adopted a “First Report and Order” in 2002. Unfortunately the regulations that ...
  • Self-calibrating closed-loop circuit for configurable constant voltage thermal anemometers 

    Gorreta Mariné, Sergio; Barajas Ojeda, Enrique; Kowalski, Lukasz; Atienza García, María Teresa; Domínguez Pumar, Manuel; Jiménez Serres, Vicente (Institution of Electrical Engineers, 2015-09-17)
    Article
    Open Access
    A new circuit is described which applies a configurable voltage across an RTD while the current flowing through it is measured with a current mirror. The circuit also allows working with voltages above the IC supply voltage ...
  • Single-MOSFET DC thermal sensor for RF-amplifier central frequency extraction 

    Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Barajas Ojeda, Enrique; León, Javier; Vellvehi, Miquel; Jordà, Xavier; Altet Sanahujes, Josep (2017-09-01)
    Article
    Open Access
    © 2017 Elsevier B.V. A DC thermal sensor based on a single metal-oxide-semiconductor field-effect transistor (MOSFET) is proposed to extract high-frequency electrical features of embedded circuits. The MOSFET sensor is ...
  • Thermal phase lag heterodyne infrared imaging for current tracking in radio frequency integrated circuits 

    Perpiñà Gilabet, Xavier; León, Javier; Altet Sanahujes, Josep; Vellvehi, Miquel; Reverter Cubarsí, Ferran; Barajas Ojeda, Enrique; Jordà, Xavier (2017-02-27)
    Article
    Open Access
    With thermal phase lag measurements, current paths are tracked in a Class A radio frequency (RF) power amplifier at 2 GHz. The amplifier is heterodynally driven at 440 MHz and 2 GHz, and its resulting thermal field was ...