Now showing items 1-9 of 9

    • A detailed methodology to compute soft error rates in advanced technologies 

      Riera Villanueva, Marc; Canal Corretger, Ramon; Abella Ferrer, Jaume; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Conference report
      Restricted access - publisher's policy
      System reliability has become a key design aspect for computer systems due to the aggressive technology miniaturization. Errors are typically dominated by transient faults due to radiation and are strongly related to the ...
    • Analysis of SoftError Rates for future technologies 

      Riera Villanueva, Marc (Universitat Politècnica de Catalunya, 2015-07)
      Master thesis
      Open Access
      La fiabilitat s'ha convertit en un aspecte important del disseny de sistemes informàtics a causa de la miniaturització de la tecnologia. En aquest projecte s'analitza la fiabilitat de les tecnologies actuals i futures ...
    • CGPA: Coarse-Grained Pruning of Activations for Energy-Efficient RNN Inference 

      Riera Villanueva, Marc; Arnau Montañés, José María; González Colás, Antonio María (2019-09-01)
      Article
      Open Access
      Recurrent neural networks (RNNs) perform element-wise multiplications across the activations of gates. We show that a significant percentage of activations are saturated and propose coarse-grained pruning of activations ...
    • Computation reuse in DNNs by exploiting input similarity 

      Riera Villanueva, Marc; Arnau Montañés, José María; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2018)
      Conference report
      Restricted access - publisher's policy
      In recent years, Deep Neural Networks (DNNs) have achieved tremendous success for diverse problems such as classification and decision making. Efficient support for DNNs on CPUs, GPUs and accelerators has become a prolific ...
    • Cross-layer system reliability assessment framework for hardware faults 

      Vallero, Alessandro; Savino, Alessandro; Politano, Gianfranco; Di Carlo, Stefano; Chatzidimitriou, Athanansios; Tselonis, Sotiris; Kaliorakis, Manolis; Gizipoulos, Dimitris; Riera Villanueva, Marc; Canal Corretger, Ramon; González Colás, Antonio María; Kooli, Maha; Bosio, Alberto; Di Natale, Giorgio (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Conference report
      Open Access
      System reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction ...
    • Disseny i Implementació d'una jerarquia de memòria en un processador MIPS 

      Riera Villanueva, Marc (Universitat Politècnica de Catalunya, 2013-06-18)
      Bachelor thesis
      Open Access
      [CATALÀ] Primer s'explicarà breument l'arquitectura d'un MIPS, la jerarquia de memòria i el funcionament de la cache. Posteriorment s'explicarà com s'ha dissenyat i implementat una jerarquia de memòria per a un MIPS ...
    • Low-power accelerators for cognitive computing 

      Riera Villanueva, Marc (Universitat Politècnica de Catalunya, 2020-10-09)
      Doctoral thesis
      Open Access
      Deep Neural Networks (DNNs) have achieved tremendous success for cognitive applications, and are especially efficient in classification and decision making problems such as speech recognition or machine translation. Mobile ...
    • SyRA: early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems 

      Vallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanansios; Kaliorakis, Manolis; Kooli, Maha; Riera Villanueva, Marc; Di Natale, Giorgio; Bosio, Alberto; Canal Corretger, Ramon; Gizopoulos, Dimitris; Di Carlo, Stefano; Anglada Sanchez , Martí; González Colás, Antonio María; Mariani, R. (Institute of Electrical and Electronics Engineers (IEEE), 2018-01-01)
      Article
      Open Access
      Cross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different ...
    • The dark side of DNN pruning 

      Yazdani Aminabadi, Reza; Arnau Montañés, José María; González Colás, Antonio María; Riera Villanueva, Marc (Institute of Electrical and Electronics Engineers (IEEE), 2018)
      Conference report
      Restricted access - publisher's policy
      DNN pruning has been recently proposed as an effective technique to improve the energy-efficiency of DNN-based solutions. It is claimed that by removing unimportant or redundant connections, the pruned DNN delivers higher ...