Browsing by Author "Barcons Xixons, Víctor"Més informacióMés informació

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    • Advances in dynamic AFM: from nanoscale energy dissipation to material properties in the nanoscale 

      Santos Hernández, Sergio; Gadelrab, Karim Raafat; Lai, Chia-Yun; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Verdaguer Prats, Albert; Chiesa, Matteo (2021-04-02)
      Article
      Open Access
      Since the inception of the atomic force microscope (AFM), dynamic methods (dynamic atomic force microscopy) have been very fruitful by establishing methods to quantify dissipative and conservative forces in the nanoscale ...

    • An effective strategy of real-time vision-based control for a Stewart platform 

      Rossell Garriga, Josep Maria; Vicente Rodrigo, Jesús; Rubió Massegú, Josep; Barcons Xixons, Víctor (2018)
      Conference report
      Open Access
      A Stewart platform is a kind of parallel robot which can be used for a wide variety of technological and industrial applications. In this paper, a Stewart platform designed and assembled at the Universitat Polit`ecnica de ...

    • Anharmonicity in multifrequency atomic force microscopy 

      Santos Hernández, Sergio; Barcons Xixons, Víctor (2014-07)
      Research report
      Open Access
      In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. ...

    • Cantilever dynamics in amplitude modulation AFM: continuous and discontinuous transitions 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2010-06-21)
      Article
      Open Access
      Transitions between the attractive and the repulsive force regimes for amplitude modulation atomic force microscopy (AFM) can be either discontinuous, with a corresponding jump in amplitude and phase, or continuous and ...

    • Contribució a la caracterització del microscopi de força atòmica 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2013-10-31)
      Doctoral thesis
      Open Access
      Des de la seva creació, el microscopi de força atòmica (AFM) ha estat àmpliament utilitzat sobretot per la caracterització de superfícies, obtenint imatges topogràfiques amb una resolució espacial de l’ordre o fins i tot ...

    • Deconstructing the governing dissipative phenomena in the nanoscale 

      Santos Hernández, Sergio; Amadei, Carlo Alberto; Tang, Tzu-Chieh; Barcons Xixons, Víctor; Chiesa, Matteo (2014-01)
      Research report
      Open Access
      An expression describing the controlling parameters involved in short range nanoscale dissipation is proposed and supported by simulations and experimental findings. The expression is deconstructed into the geometrical, ...

    • ELECTRONIC SYSTEMS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-05-31)
      Exam
      Restricted access - author's decision

    • ELECTRONIC SYSTEMS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-04-05)
      Exam
      Restricted access - author's decision

    • ELECTRONIC SYSTEMS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-06-21)
      Exam
      Restricted access - author's decision

    • ELECTRONIC SYSTEMS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2022-06-21)
      Exam
      Restricted access - author's decision

    • Energy dissipation in the presence of sub-harmonic excitation in dynamic atomic force microscopy 

      Chiesa, Matteo; Gadelrab, Karim Raafat; Verdaguer, Albert; Segura, Juan José; Barcons Xixons, Víctor; Thomson, Neil H.; Phillips, M.A.; Stefancich, M.; Santos Hernández, Sergio (2012-09)
      Article
      Open Access
      Amplitude modulation atomic force microscopy allows quantifying energy dissipation in the nanoscale with great accuracy with the use of analytical expressions that account for the fundamental frequency and higher harmonics. ...

    • Establishing nanoscale heterogeneity with nanoscale force measurements 

      Chang, Yun-Hsiang, Yun-Hsiang; Olukan, Tuza; Lai, Chia-Yun; Santos, Sergio; Lin, Tze-Yu; Apostoleris, Harry; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2015-08-13)
      Article
      Open Access
      Establishing the presence or absence of nanoscale compositional heterogeneity with nanoscale resolution is becoming instrumental for the development of many fields of science. Force versus distance measurements and parameters ...

    • How localized are energy dissipation processes in nanoscale interactions? 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Verdaguer, Albert; Font Teixidó, Josep; Thomson, Neil H.; Chiesa, Mateo (2011-07-29)
      Article
      Open Access
      We describe fundamental energy dissipation in dynamic nanoscale processes in terms of the localization of the interactions. In this respect, the areal density of the energy dissipated and the effective area of interaction ...

    • Investigation of nanoscale interactions by means of subharmonic excitation 

      Santos Hernández, Sergio; Phillips, M.A.; Verdaguer, Albert; Font Teixidó, Josep; Chiesa, Matteo; Gadelrab,, K.; Stefancich, M.; Armstrong, P.; Li, G.; Souier, T.; Thomson, Neil H.; Barcons Xixons, Víctor (2012-08-16)
      Article
      Restricted access - publisher's policy
      Multifrequency atomic force microscopy holds promise as a method to provide qualitative and quantitative information about samples with high spatial resolution. Here, we provide experimental evidence of the excitation of ...

    • Periodicity in bimodal atomic force microscopy 

      Lai, Chia-Yun; Barcons Xixons, Víctor; Santos, Sergio; Chiesa, Matteo (American Institute of Physics (AIP), 2015-07-28)
      Article
      Open Access
      Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship ...

    • Quantification of dissipation and deformation in ambient atomic force microscopy 

      Santos Hernández, Sergio; Gadelrab,, K.; Barcons Xixons, Víctor; Stefancich, M.; Chiesa, Matteo (2012-07-20)
      Article
      Restricted access - publisher's policy
      A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the ...

    • SISTEMES ELECTRÒNICS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2021-04-14)
      Exam
      Restricted access - author's decision

    • SISTEMES ELECTRÒNICS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2021-04-20)
      Exam
      Restricted access - author's decision

    • SISTEMES ELECTRÒNICS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2021-06-01)
      Exam
      Restricted access - author's decision

    • SISTEMES ELECTRÒNICS 

      Barcons Xixons, Víctor (Universitat Politècnica de Catalunya, 2021-06-16)
      Exam
      Restricted access - author's decision