Now showing items 1-20 of 36

    • An Efficient behavioral description frontend tool for mixed-mode SPICE simulation 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan; Chatterjee, Abhijit (2014)
      Conference report
      Open Access
    • Analog circuit test based on a digital signature 

      Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2010)
      Conference report
      Open Access
      Production verification of analog circuit specifica- tions is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost on-chip parameter verification ...
    • Analog circuits testing using digitally coded indirect measurements 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
      Conference report
      Restricted access - publisher's policy
      Testing mixed-signal circuits is a challenging task requiring high amounts of human and technical resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform ...
    • Arc tracking control in insulation systems for aeronautic applications: challenges, opportunities, and research needs 

      Riba Ruiz, Jordi-Roger; Gómez Pau, Álvaro; Moreno Eguilaz, Juan Manuel; Bogarra Rodríguez, Santiago (Multidisciplinary Digital Publishing Institute (MDPI), 2020-03-16)
      Article
      Open Access
      Next generation aircrafts will use more electrical power to reduce weight, fuel consumption, system complexity and greenhouse gas emissions. However, new failure modes and challenges arise related to the required voltage ...
    • Black-box modelling of a DC-DC buck converter based on a recurrent neural network 

      Rojas Dueñas, Gabriel; Riba Ruiz, Jordi-Roger; Moreno Eguilaz, Juan Manuel; Kadechkar, Akash; Gómez Pau, Álvaro (Institute of Electrical and Electronics Engineers (IEEE), 2020)
      Conference lecture
      Open Access
      Neural network; Power converter; Training; Prediction; System identification; Black-box model
    • Built-In test of MEMS capacitive accelerometers for field failures and aging degradation. 

      Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2012)
      Conference report
      Open Access
    • Criteria for indirect measurements in M-S testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2014)
      Conference report
      Restricted access - author's decision
      Analog and mixed-signal circuit testing is a cballenging task demanding large amounts of resources. In order to battle against this drawback, alternate testing has been established as an eflicient way of testing analog ...
    • Criteria for selecting a subset of indirect measurements for analog testing 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2016)
      Conference report
      Restricted access - publisher's policy
      This work proposes a criterion to select a subset of indirect measurements avoiding redundant information. The key idea of the proposal is to reduce the actual number of measurements to be performed to those strictly ...
    • Design, Fabrication and Veri cation of a Mixed-Signal XY Zone Monitoring Circuit and its Application to a Phase Lock Loop Circuit 

      Gómez Pau, Álvaro (Universitat Politècnica de Catalunya, 2010-06)
      Master thesis (pre-Bologna period)
      Open Access
      El presente proyecto de final de carrera se centra en el diseño, análisis e implementación en silicio de una metodología de test/diagnosis basada en la comparación de firmas digitales generadas a partir de curvas de ...
    • Digital signature generator for mixed-signal testing 

      Sanahuja Moliner, Ricard; Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2009)
      Conference report
      Open Access
      Es presenta un nou generador de signatures digitals per controlar dues senyals anàlogues. Es presenta la tecnologia STM 65 nm per demostrar la viabilitat de la proposta.
    • Efficient production binning using octree tessellation in the alternate measurements space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2015)
      Article
      Open Access
      Binning after volume production is a widely accepted technique to classify fabricated ICs into different clusters depending on different degrees of specification compliance. This allows the manufacturer to sell non optimal ...
    • Error resilient real-time state variable systems signal processing and control 

      Banerjee, Suvadeep; Gómez Pau, Álvaro; Chatterjee, Abhijit; Abraham, Jacob (2014)
      Conference report
      Restricted access - publisher's policy
    • Experimental study of the corona performance of aged sand-cast substation connectors 

      Riba Ruiz, Jordi-Roger; Bogarra Rodríguez, Santiago; Gómez Pau, Álvaro; Moreno Eguilaz, Juan Manuel (2020-06-01)
      Article
      Open Access
      Substation connectors, like many other high-voltage products, are tested once manufactured. However, the corona behavior of aged specimens can differ from that exhibited by newer ones, thus generating detrimental technical ...
    • Experimental study of visual corona under aeronautic pressure conditions using low-cost imaging sensors 

      Riba Ruiz, Jordi-Roger; Gómez Pau, Álvaro; Moreno Eguilaz, Juan Manuel (Multidisciplinary Digital Publishing Institute (MDPI), 2020-01-11)
      Article
      Open Access
      Visual corona tests have been broadly applied for identifying the critical corona points of diverse high-voltage devices, although other approaches based on partial discharge or radio interference voltage measurements are ...
    • Identification of component deviations in analog circuits using digital signatures 

      Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan (2011)
      Conference report
      Restricted access - publisher's policy
      Analog circuits component diagnosis is a challenging task requiring expensive resources. This paper presents a low cost method to identify deviations in multiple component values using a precharacterisation of the impact ...
    • Impact of laser attacks on the switching behavior of RRAM devices 

      Arumi Delgado, Daniel; Manich Bou, Salvador; Gómez Pau, Álvaro; Rodríguez Montañés, Rosa; Montilla, Víctor; Hernández, David; Bargalló González, Mireia; Campabadal, Francesca (2020-01-20)
      Article
      Open Access
      The ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative ...
    • Improving indirect test efficiency using multi-directional tessellations in the measure space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2016)
      Conference report
      Restricted access - publisher's policy
      Indirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever increasing device verification costs. This work explores the ...
    • Indirect and adaptive test of analogue circuits based on preselected steady-state response measures 

      Gómez Pau, Álvaro; Lupón Roses, Emilio; Balado Suárez, Luz María; Figueras, Joan (2020-08-01)
      Article
      Open Access
      Alternate testing techniques have been progressively adopted as a promising solution due to their effectiveness against classical specification-based test methods. This work presents a built-in test system, which adaptively ...
    • Indirect test of M-S circuits using multiple specification band guarding 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2016-09-01)
      Article
      Open Access
      Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ...
    • M-S test based on specification validation using octrees in the measure space 

      Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2013)
      Conference report
      Restricted access - publisher's policy
      Testing M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform specification based tests using easy ...