Browsing by Author "Maya Sánchez, Mª del Carmen"
Now showing items 1-7 of 7
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A method for characterizing coplanar waveguide-to-microstrip transitions, and its application to the measurement of microstrip devices with coplanar microprobes
(JOHN WILEY & SONS INC, 2003-12-31)
Article
Open AccessThis paper presents a method for characterizing coplanar waveguide-to-microstrip (CPW-M) transitions by using on-wafer coplanar (CPW) microprobes. It is based on extracting the transmission matrix of the CPW-M transition ... -
A Method for the Determination of a Distributed FET Noise-Model Based on Matched-Source Noise-Figure Measurements
(JOHN WILEY & SONS INC, 2004-05-31)
Article
Open AccessA new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noise-correlation matrix of an elemental section of the device from the device's noise figure, ... -
A Method to Simultaneously Extract the Small-Signal Equivalent Circuit and Noise Parameters of Heterojunction Bipolar Transistors
(JOHN WILEY & SONS INC, 2006-07-31)
Article
Open AccessA method to extract the elements of the small-signal equivalent circuit and the noise parameters (NPs) of heterojunction bipolar transistors (HBTs) is presented. The extraction is done by simultaneous fitting of the measured ... -
Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model
(JOHN WILEY & SONS INC, 2003-11-30)
Article
Open AccessThe bias-dependence of microwave-FET intrinsic noise sources in their hybrid configuration is theoretically determined, using a new quasi-2D (Q-2D) physical model based on Thornber's current equation [8]. It is shown that ... -
Extraction of an avalanche diode noise model for its application as on-wafer noise source
(JOHN WILEY & SONS INC, 2003-07-31)
Article
Open AccessThis paper presents a method to characterize the excess noise ratio (ENR) of an unmatched avalanche noise diode for application as an on-wafer noise source. It is based on the determination of a broadband device noise ... -
Measurement of on-wafer transistor noise parameters without a tuner using unrestricted noise sources
(HORIZON HOUSE PUBLICATIONS INC, 2002-03-31)
Article
Open AccessThe authors present a method for calibrating the four noise parameters of a noise receiver which does not require a tuner The method permits using general (mismatched) noise sources, which may present very different source ... -
Noise model of a reverse-biased Cold-FET applied to the characterization of its ENR
(JOHN WILEY & SONS INC, 2004-02-28)
Article
Open AccessThis paper presents a broadband-noise circuit model for a cold-FET (Vds = 0 V) with a reverse-biased gate. The noise model includes two intrinsic uncorrelated noise-current sources whose spectral densities are determined ...
