Now showing items 1-5 of 5

    • Error probability in synchronous digital circuits due to power supply noise 

      Martorell Cid, Ferran; Pons Solé, Marc; Rubio, Antonio; Moll Echeto, Francisco de Borja (2007-09)
      Conference report
      Open Access
      This paper presents a probabilistic approach to model the problem of power supply voltage fluctuations. Error probability calculations are shown for some 90-nm technology digital circuits. The analysis here considered ...
    • Error probability in synchronous digital circuits due to power supply noise 

      Martorell Cid, Ferran; Pons, M; Rubio Sola, Jose Antonio; Moll Echeto, Francisco de Borja (???, 2007)
      Conference report
      Open Access
      This paper presents a probabilistic approach to model the problem of power supply voltage fluctuations. Error probability calculations are shown for some 90-nm technology digital circuits. The analysis here considered ...
    • Power supply noise and logic error probability 

      Andrade Miceli, Dennis Michael; Martorell Cid, Ferran; Pons Solé, Marc; Moll Echeto, Francisco de Borja; Rubio, Antonio (2007-08)
      Conference report
      Open Access
      Voltage fluctuations caused by parasitic impedances in the power supply rails of modern ICs are a major concern in nowadays ICs. The voltage fluctuations are spread out to the diverse nodes of the internal sections causing ...
    • RTL-aware dataflow-driven macro placement 

      Vidal Obiols, Alexandre; Cortadella, Jordi; Petit Silvestre, Jordi; Galcerán Oms, Marc; Martorell Cid, Ferran (Institute of Electrical and Electronics Engineers (IEEE), 2019)
      Conference report
      Open Access
      When RTL designers define the hierarchy of a system, they exploit their knowledge about the conceptual abstractions devised during the design and the functional interactions between the logical components. This valuable ...
    • Voltage fluctuations in IC power supply distribution 

      Andrade Miceli, Dennis Michael; Martorell Cid, Ferran; Moll Echeto, Francisco de Borja; Rubio, Antonio (2007-11)
      Conference report
      Open Access
      The supply voltage decrease and power consumption increase of modern ICs made the requirements for low voltage fluctuation caused by packaging and on-chip parasitic impedances more difficult to achieve. Most of the research ...