Browsing by Author "Aldrete Vidrio, Héctor"
Now showing items 1-5 of 5
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Frequency characterization of a 2.4 GHz CMOS LNA by Thermal Measurements
(Institute of Electrical and Electronics Engineers (IEEE), 2006)
Conference report
Open AccessThis paper presents a technique to obtain electrical characteristics of analog and RF circuits, based on measuring temperature at the silicon surface close to the circuit under test. Experimental results validate the ... -
Non-invasive RF built-in testing using on-chip temperature sensors
(IEEE Computer Society Publications, 2009-11)
Other
Open AccessThis poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors. -
Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes
(Institute of Electrical and Electronics Engineers (IEEE), 2014)
Conference report
Restricted access - publisher's policyThis paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. ... -
Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits
(2010)
Conference report
Open AccessIn this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits. -
Using temperature as observable of the frequency response of RF CMOS amplifiers
(Institute of Electrical and Electronics Engineers (IEEE), 2008)
Conference report
Open AccessThe power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature ...
