Browsing by Author "Canal Corretger, Ramon"
Now showing items 1-20 of 64
-
2D error correction for F/F based arrays using in-situ Real-Time Error Detection (RTD)
Sazeides, Yiannakis; Bramnik, Arkady; Gabor, Ron; Nicopoulos, Chrysostomos; Canal Corretger, Ramon; Konstantinou, Dimitris; Dimitrakopoulos, Giorgos (Institute of Electrical and Electronics Engineers (IEEE), 2020)
Conference lecture
Open AccessThis work proposes in-situ Real-Time Error Detection (RTD): embedding hardware in a memory array for detecting a fault in the array when it occurs, rather than when it is read. RTD breaks the serialization between data ... -
A cost-effective clustered architecture
Canal Corretger, Ramon; Parcerisa Bundó, Joan Manuel; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 1999)
Conference report
Open AccessIn current superscalar processors, all floating-point resources are idle during the execution of integer programs. As previous works show, this problem can be alleviated if the floating-point cluster is extended to execute ... -
A cost-efficient QoS-aware analytical model of future software content delivery networks
Otero Calviño, Beatriz; Rodríguez Luna, Eva; Rojas, Otilio; Verdú Mulà, Javier; Costa Prats, Juan José; Pajuelo González, Manuel Alejandro; Canal Corretger, Ramon (2020-08-31)
Article
Restricted access - publisher's policyFreelance, part-time, work-at-home, and other flexible jobs are changing the concept of workplace, and bringing information and content exchange problems to companies. Geographically spread corporations may use remote ... -
A detailed methodology to compute soft error rates in advanced technologies
Riera Villanueva, Marc; Canal Corretger, Ramon; Abella Ferrer, Jaume; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2016)
Conference report
Restricted access - publisher's policySystem reliability has become a key design aspect for computer systems due to the aggressive technology miniaturization. Errors are typically dominated by transient faults due to radiation and are strongly related to the ... -
A novel variation-tolerant 4T-DRAM cell with enhanced soft-error tolerance
Ganapathy, Shrikanth; Canal Corretger, Ramon; Alexandrescu, Dan; Costenaro, Enrico; González Colás, Antonio María; Rubio Sola, Jose Antonio (IEEE Computer Society Publications, 2012)
Conference report
Restricted access - publisher's policyIn view of device scaling issues, embedded DRAM (eDRAM) technology is being considered as a strong alternative to conventional SRAM for use in on-chip memories. Memory cells designed using eDRAM technology in addition ... -
An energy-efficient and scalable eDRAM-based register file architecture for GPGPU
Jing, Naifeng; Shen, Yao; Lu, Yao; Ganapathy, Shrikanth; Mao, Zhigang; Guo, Minyi; Canal Corretger, Ramon; Liang, Xiaoyao (ACM, 2013)
Conference report
Restricted access - publisher's policyThe heavily-threaded data processing demands of streaming multiprocessors (SM) in a GPGPU require a large register file (RF). The fast increasing size of the RF makes the area cost and power consumption unaffordable for ... -
An hybrid eDRAM/SRAM macrocell to implement first-level data caches
Valero, Alejandro; Sahuquillo, Julio; Petit, Salvador; Lorente, Vicente; Canal Corretger, Ramon; López, Pedro; Duato, José (Association for Computing Machinery (ACM), 2009)
Conference report
Restricted access - publisher's policySRAM and DRAM cells have been the predominant technologies used to implement memory cells in computer systems, each one having its advantages and shortcomings. SRAM cells are faster and require no refresh since reads are ... -
Challenges in deeply heterogeneous high performance systems
Agosta, Giovanni; Fornaciari, William; Atienza, David; Canal Corretger, Ramon; Cilardo, Alessandro; Flich Cardo, José; Hernández Luz, Carles; Kulczewski, Michal; Massari, Giuseppe; Tornero Gavilá, Rafael; Zapater Sancho, Marina (Institute of Electrical and Electronics Engineers (IEEE), 2019)
Conference report
Open AccessRECIPE (REliable power and time-ConstraInts-aware Predictive management of heterogeneous Exascale systems) is a recently started project funded within the H2020 FETHPC programme, which is expressly targeted at exploring ... -
Circuit propagation delay estimation through multivariate regression-based modeling under spatio-temporal variability
Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2010)
Conference report
Restricted access - publisher's policyWith every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits. Propagation delays which decide circuit ... -
Combining RAM technologies for hard-error recovery in L1 data caches working at very-low power modes
Lorente, Vicente; Valero, Alejandro; Sahuquillo, Julio; Petit, Salvador; Canal Corretger, Ramon; López, Pedro; Duato, José (2013)
Conference report
Restricted access - publisher's policyLow-power modes in modern microprocessors rely on low frequencies and low voltages to reduce the energy budget. Nevertheless, manufacturing induced parameter variations can make SRAM cells unreliable producing hard errors ... -
Comparison of SRAM cells for 10-nm SOI FinFETs under process and environmental variations
Jaksic, Zoran; Canal Corretger, Ramon (2012-12)
Article
Restricted access - publisher's policyWe explore the 6T and 8T SRAM design spaces through read static noise margin (RSNM), word-line write margin, and leakage for future 10-nm FinFETs. Process variations are based on the ITRS and modeled at device (TCAD) level. ... -
Cross-layer system reliability assessment framework for hardware faults
Vallero, Alessandro; Savino, Alessandro; Politano, Gianfranco; Di Carlo, Stefano; Chatzidimitriou, Athanansios; Tselonis, Sotiris; Kaliorakis, Manolis; Gizipoulos, Dimitris; Riera Villanueva, Marc; Canal Corretger, Ramon; González Colás, Antonio María; Kooli, Maha; Bosio, Alberto; Di Natale, Giorgio (Institute of Electrical and Electronics Engineers (IEEE), 2016)
Conference report
Open AccessSystem reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction ... -
DRAM-based coherent caches and how to take advantage of the coherence protocol to reduce the refresh energy
Jaksic, Zoran; Canal Corretger, Ramon (European Interactive Digital Advertising Alliance (EDAA), 2014)
Conference report
Restricted access - publisher's policyRecent technology trends has turned DRAMs into an interesting candidate to substitute traditional SRAM-based on-chip memory structures (i.e. register file, cache memories). Nevertheless, a major problem to introduce these ... -
Dynamic cluster assignment mechanisms
Canal Corretger, Ramon; Parcerisa Bundó, Joan Manuel; González Colás, Antonio María (Institute of Electrical and Electronics Engineers (IEEE), 2000)
Conference report
Open AccessClustered microarchitectures are an effective approach to reducing the penalties caused by wire delays inside a chip. Current superscalar processors have in fact a two-cluster microarchitecture with a naive code partitioning ... -
Dynamic fine-grain body biasing of caches with latency and leakage 3T1D-based monitors
Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (2011-04-15)
External research report
Open AccessIn this paper, we propose a dynamically tunable fine-grain body biasing mechanism to reduce active & standby leakage power in caches under process variations. -
Effectiveness of hybrid recovery techniques on parametric failures
Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio (Institute of Electrical and Electronics Engineers (IEEE), 2013)
Conference report
Restricted access - publisher's policyModern day microprocessors effectively utilise supply voltage scaling for tremendous power reduction. The minimum voltage beyond which a processor cannot operate reliably is defined as V ddmin. On-chip memories like caches ... -
Elastic cooperative caching: an autonomus dynamically adaptive memory hierarchy for chip multiprocessors
Herrero Abellanas, Enric; González, José; Canal Corretger, Ramon (Association for Computing Machinery (ACM), 2010)
Conference report
Restricted access - publisher's policyNext generation tiled microarchitectures are going to be limited by off-chip misses and by on-chip network usage. Furthermore, these platforms will run an heterogeneous mix of applications with very different memory needs, ... -
Enhancing 3T DRAMs for SRAM replacement under 10nm tri-gate SOI FinFETs
Jaksic, Zoran; Canal Corretger, Ramon (IEEE Computer Society Publications, 2012)
Conference report
Restricted access - publisher's policyIn this paper, we pr esent the dynamic 3T memory cell for future 10nm tri-gate FinFETs as a potential replacement for classical 6T SRAM cell for implementation in high speed cache memories. We investigate read access ... -
FinFET and III-V/Ge technology impact on 3T1D cell behavior
Amat Bertran, Esteve; Calomarde Palomino, Antonio; Almudever, Carmen G.; Aymerich Capdevila, Nivard; Canal Corretger, Ramon; Rubio Sola, Jose Antonio (2013)
Conference lecture
Open AccessIn this work, we assess the performance of a ring oscillator and a DRAM cell when they are implemented with different technologies (planar CMOS, FinFET and III-V MOSFETs), and subjected to different reliability ... -
Impact of finfet and III-V/Ge technology on logic and memory cell behavior
Amat Bertran, Esteve; Calomarde Palomino, Antonio; García Almudéver, Carmen; Aymerich Capdevila, Nivard; Canal Corretger, Ramon; Rubio Sola, Jose Antonio (2013-11-20)
Article
Restricted access - publisher's policyIn this work, we assess the performance of a ring oscillator and a DRAM cell when they are implemented with different technologies (planar CMOS, FinFET and III-V MOSFETs), and subjected to different reliability scenarios ...