Now showing items 1-7 of 7

    • Charge trapping control in MOS capacitors 

      Domínguez Pumar, Manuel; Bheesayagari, Chenna Reddy; Gorreta Mariné, Sergio; López Rodríguez, Gema; Martín García, Isidro; Blokhina, Elena; Pons Nin, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2016-12-26)
      Article
      Open Access
      This paper presents an active control of C-V characteristic for MOS capacitors based on Sliding Mode control and sigma-delta-modulation. The capacitance of the device at a certain voltage is measured periodically and ...
    • Closed-loop compensation of charge trapping induced by ionizing radiation in MOS capacitors 

      Domínguez Pumar, Manuel; Bheesayagari, Chenna Reddy; Gorreta Mariné, Sergio; Lopez Chavez, G.; Pons Nin, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2017-08-31)
      Article
      Open Access
      The objective of this work is to explore the capability of a charge trapping control loop to continuously compensate charge induced by ionizing radiation in the dielectric of MOS capacitors. To this effect, two devices ...
    • Condution mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors 

      Bheesayagari, Chenna Reddy; Pons Nin, Joan; Orpella García, Alberto; Véliz Noboa, Bremnen Marino; Bermejo Broto, Sandra; Domínguez Pumar, Manuel (2020-06-20)
      Article
      Open Access
      The objective of this paper is to present a charge trapping control method for MIM capacitors in whichthe dielectric is made of electrospray-deposited silica nanoparticles. The influence of the bias voltage onthe impedance ...
    • Diffusive representation and sliding mode control of charge trapping in Al2O3MOS capacitors 

      Bheesayagari, Chenna Reddy; Pons Nin, Joan; Atienza García, María Teresa; Domínguez Pumar, Manuel (Institute of Electrical and Electronics Engineers (IEEE), 2019-01-01)
      Article
      Open Access
      The objective of this paper is to introduce a modeling strategy to characterize the dynamics of the charge trapped in the dielectric of MOS capacitors, using Diffusive Representation. Experimental corroboration is presented ...
    • Second order sigma-delta control of charge trapping for MOS capacitors 

      Bheesayagari, Chenna Reddy; Gorreta Mariné, Sergio; Pons Nin, Joan; Domínguez Pumar, Manuel (2017-09-01)
      Article
      Open Access
      This paper presents the circuit topology of a second order sigma-delta control of charge trapping for MOS capacitors. With this new topology it is possible to avoid the presence of plateaus that can be found in first-order ...
    • Sigma-Delta control of charge trapping in heterogeneous devices 

      Bheesayagari, Chenna Reddy (Universitat Politècnica de Catalunya, 2019-11-04)
      Doctoral thesis
      Open Access
      Dielectric charging represents a major reliability issue in a variety of semiconductor devices. The accumulation of charge in dielectric layers of a device often alters its performance, affecting its circuital features and ...
    • Stabilization of the J-V characteristic of a perovskite solar cell using an intelligent control loop 

      Bheesayagari, Chenna Reddy; Martínez-Denegrí Sánchez, Guillermo; Orpella García, Alberto; Pons Nin, Joan; Bermejo Broto, Sandra; Alcubilla González, Ramón; Martorell Pena, Jordi; Domínguez Pumar, Manuel (2021-01-02)
      Article
      Open Access
      The phenomena related to charge trapping are among the most relevant open issues that affect the long-term stability of perovskite-based devices. According to this, the objective of this paper is to report experimental ...