Now showing items 1-5 of 5

  • Charge trapping control in MOS capacitors 

    Domínguez Pumar, Manuel; Bheesayagari, Chenna Reddy; Gorreta Mariné, Sergio; López Rodríguez, Gema; Martín García, Isidro; Blokhina, Elena; Pons Nin, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2016-12-26)
    Article
    Open Access
    This paper presents an active control of C-V characteristic for MOS capacitors based on Sliding Mode control and sigma-delta-modulation. The capacitance of the device at a certain voltage is measured periodically and ...
  • Closed-loop compensation of charge trapping induced by ionizing radiation in MOS capacitors 

    Domínguez Pumar, Manuel; Bheesayagari, Chenna Reddy; Gorreta Mariné, Sergio; Lopez Chavez, G.; Pons Nin, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2017-08-31)
    Article
    Open Access
    The objective of this work is to explore the capability of a charge trapping control loop to continuously compensate charge induced by ionizing radiation in the dielectric of MOS capacitors. To this effect, two devices ...
  • Diffusive representation and sliding mode control of charge trapping in Al2O3MOS capacitors 

    Bheesayagari, Chenna Reddy; Pons Nin, Joan; Atienza García, María Teresa; Domínguez Pumar, Manuel (Institute of Electrical and Electronics Engineers (IEEE), 2019-01-01)
    Article
    Open Access
    The objective of this paper is to introduce a modeling strategy to characterize the dynamics of the charge trapped in the dielectric of MOS capacitors, using Diffusive Representation. Experimental corroboration is presented ...
  • Second order sigma-delta control of charge trapping for MOS capacitors 

    Bheesayagari, Chenna Reddy; Gorreta Mariné, Sergio; Pons Nin, Joan; Domínguez Pumar, Manuel (2017-09-01)
    Article
    Open Access
    This paper presents the circuit topology of a second order sigma-delta control of charge trapping for MOS capacitors. With this new topology it is possible to avoid the presence of plateaus that can be found in first-order ...
  • Sigma-Delta control of charge trapping in heterogeneous devices 

    Bheesayagari, Chenna Reddy (Universitat Politècnica de Catalunya, 2019-11-04)
    Doctoral thesis
    Open Access
    Dielectric charging represents a major reliability issue in a variety of semiconductor devices. The accumulation of charge in dielectric layers of a device often alters its performance, affecting its circuital features and ...