• Determination of shape and sphericity of silicon quantum dots imaged by EFTEM-tomography 

      Ayala Vallespí, M. Dolors; Hiller, Daniel; Gutsch, Sebastian; López Vidrier, Julián; Zacharias, Margit; Estradé Albiol, Sònia; Peiró Martínez, Francesca; Cruz-Matías, Irving (2017-11-06)
      Article
      Accés obert
      The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by ...
    • Insights into interface and bulk defects in a high efficiency kesterite-based device 

      Fonoll Rubio, Robert; Andrade Arvizu, Jacob; Blanco Portals, Javier; Becerril Romero, Ignacio; Guc, Maxim; Saucedo Silva, Edgardo Ademar; Peiró Martínez, Francesca; Estradé Albiol, Sònia; Izquierdo Roca, Víctor; Pérez Rodríguez, Alejandro (2021-01-01)
      Article
      Accés obert
      This work provides a detailed analysis of a high efficiency Cu2ZnSnSe4 device using a combination of advanced electron microscopy and spectroscopy techniques. In particular, a full picture of the different defects present ...
    • Sphericity and roundness computation for particles using the extreme vertices model 

      Cruz Matías, Irving; Ayala Vallespí, M. Dolors; Hiller, Daniel; Gutsch, Sebastian; Zacharias, Margit; Estradé, Sònia; Peiró Martínez, Francesca (Elsevier, 2019-01-01)
      Article
      Accés obert
      Shape is a property studied for many kinds of particles. Among shape parameters, sphericity and roundness indices had been largely studied to understand several processes. Some of these indices are based on length measurements ...