PublisherIEEE Press. Institute of Electrical and Electronics Engineers
Rights accessOpen Access
This paper presents an experimental analysis of the performance degradation of an LC-Voltage Controlled Oscillator (LC-VCO) produced by high frequency noise present in the substrate. The spurs observed are shown to be caused by a frequency pulling mechanism. Based on the theory of injection
locked oscillators, a new analytical model to predict the behavior of the LC-VCO under the effect of high frequency substrate
noise is presented. The analytical model, which is successfully compared with experimental measurements on a 7 GHz LCVCO,
provides rapid intuition on the relation between spurs and circuit parameters.
CitationMolina, M. [et al.]. Effect of high frequency substrate noise on LC-VCOs. A: IEEE International Midwest Symposium on Circuits and Systems. "2010 53rd IEEE International Midwest Symposium on Circuits and Systems". Seattle: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 157-160.
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