Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Rights accessOpen Access
We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage.
CitationNguyen, T.; O'Callaghan, J. M.; Davidson, B. A.; Redwing, R. D.; Hohenwarter, G. K. G.; Nordman, J. E.; Beyer, J. B.; Mechanisms for conduction via low-frequency noise measurements of high-Tc/sub c/thin film microbridges. IEEE Transactions on applied superconductivity, 1995, vol. 5, núm. 2, p. 3369-3372.
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