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dc.contributor.authorMéndez, M A
dc.contributor.authorMateo Peña, Diego
dc.contributor.authorAragonès Cervera, Xavier
dc.contributor.authorGonzález Jiménez, José Luis
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2010-10-06T13:35:37Z
dc.date.available2010-10-06T13:35:37Z
dc.date.created2005
dc.date.issued2005
dc.identifier.citationMéndez, M. [et al.]. Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling. A: 31st European Solid-State Circuits Conference. "31st European Solid-State Circuits Conference". Grenoble: IEEE, 2005, p. 105-108.
dc.identifier.isbn0-7803-9205-1
dc.identifier.urihttp://hdl.handle.net/2117/9460
dc.description.abstractThe present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the oscillator due to the substrate and the package are analyzed, indicating that both noise at low frequencies and at high frequencies around the oscillation fundamental significantly degrade phase noise.
dc.format.extent4 p.
dc.language.isoeng
dc.publisherIEEE
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació
dc.subject.lcshRadio frequency
dc.subject.lcshSignal theory (Telecommunication)
dc.subject.lcshElectronic noise
dc.subject.lcshVoltage-controlled oscillators
dc.titlePhase noise degradation of LC-tank VCOs due to substrate noise and package coupling
dc.typeConference report
dc.subject.lemacSenyal, Teoria del (Telecomunicació)
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.identifier.doi10.1109/ESSCIR.2005.1541569
dc.relation.publisherversionhttp://ieeexplore.ieee.org/search/srchabstract.jsp?arnumber=1541569&isnumber=32889&punumber=10265&k2dockey=1541569@ieeecnfs&query=((phase+noise+degradation)%3Cin%3Emetadata)&pos=2&access=no
dc.rights.accessOpen Access
drac.iddocument2346503
dc.description.versionPostprint (published version)
upcommons.citation.authorMéndez, M.; Mateo, D.; Aragones, X.; González, J.
upcommons.citation.contributor31st European Solid-State Circuits Conference
upcommons.citation.pubplaceGrenoble
upcommons.citation.publishedtrue
upcommons.citation.publicationName31st European Solid-State Circuits Conference
upcommons.citation.startingPage105
upcommons.citation.endingPage108
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Llevat que s'hi indiqui el contrari, els continguts d'aquesta obra estan subjectes a la llicència de Creative Commons: Reconeixement-NoComercial-SenseObraDerivada 3.0 Espanya