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Survey on fault operation on multilevel inverters
dc.contributor.author | Lezana, Pablo |
dc.contributor.author | Pou Félix, Josep |
dc.contributor.author | Meynard, Thierry A. |
dc.contributor.author | Rodríguez, José |
dc.contributor.author | Ceballos Recio, Salvador |
dc.contributor.author | Richardeau, Frédéric |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2010-09-29T15:23:36Z |
dc.date.available | 2010-09-29T15:23:36Z |
dc.date.created | 2010-07-01 |
dc.date.issued | 2010-07-01 |
dc.identifier.citation | Lezana, P. [et al.]. Survey on fault operation on multilevel inverters. "IEEE transactions on industrial electronics", 01 Juliol 2010, vol. 57, núm. 7, p. 2207-2218. |
dc.identifier.issn | 0278-0046 |
dc.identifier.uri | http://hdl.handle.net/2117/9169 |
dc.description.abstract | This paper is related to faults that can appear in multilevel (ML) inverters, which have a high number of components. This is a subject of increasing importance in high-power inverters. First, methods to identify a fault are classified and briefly described for each topology. In addition, a number of strategies and hardware modifications that allow for operation in faulty conditions are also presented. As a result of the analyzed works, it can be concluded that ML inverters can significantly increase their availability and are able to operate even with some faulty components. |
dc.format.extent | 12 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Electric current converters |
dc.subject.lcsh | Diagnostic errors |
dc.subject.other | Fault diagnosis fault tolerance multilevel (ML) converters |
dc.title | Survey on fault operation on multilevel inverters |
dc.type | Article |
dc.subject.lemac | Convertidors de corrent elèctric |
dc.subject.lemac | Errors de diagnòstic |
dc.contributor.group | Universitat Politècnica de Catalunya. (TIEG) - Terrassa Industrial Electronics Group |
dc.identifier.doi | 10.1109/TIE.2009.2032194 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://ieeexplore.ieee.org/ |
dc.rights.access | Open Access |
local.identifier.drac | 2569681 |
dc.description.version | Postprint (published version) |
local.citation.author | Lezana, P.; Pou, J.; Meynard, T.; Rodríguez, J.; Ceballos, S.; Richardeau, F. |
local.citation.publicationName | IEEE transactions on industrial electronics |
local.citation.volume | 57 |
local.citation.number | 7 |
local.citation.startingPage | 2207 |
local.citation.endingPage | 2218 |
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