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dc.contributor.authorAzcona Guerrero, Francisco Javier
dc.contributor.authorJha, Ajit
dc.contributor.authorYáñez Alvarado, Carlos René
dc.contributor.authorAtashkhooei, Reza
dc.contributor.authorRoyo Royo, Santiago
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Òptica i Optometria
dc.date.accessioned2016-09-19T11:22:10Z
dc.date.available2016-09-19T11:22:10Z
dc.date.issued2016-06-29
dc.identifier.citationAzcona, F. J., Jha, A., Yañez, C., Atashkhooei, R., Royo, S. Microcantilever Displacement Measurement Using a Mechanically Modulated Optical Feedback Interferometer. "Sensors", 29 Juny 2016, vol. 16, núm. 7, p. 997-1-997-17.
dc.identifier.issn1424-8220
dc.identifier.urihttp://hdl.handle.net/2117/90027
dc.description.abstractMicrocantilever motion detection is a useful tool for the characterization of the physical, chemical and biological properties of materials. In the past, different approaches have been proposed and tested to enhance the behavior, size and simplicity of microcantilever motion detectors. In this paper, a new approach to measure microcantilever motion with nanometric resolution is presented. The proposed approach is based on the concept of mechanically-modulated optical feedback interferometry, a technique that has shown displacement measurement capabilities well within the nanometric scale and that, due to its size, compactness and low cost, may be a suitable choice for measuring nanometric motions in cantilever-like sensors. It will be shown that the sensor, in its current state of development, is capable of following a cantilever sinusoidal trajectory at different sets of frequencies ranging up to 200 Hz and peak to peak amplitudes up to ¿/2 with experimental resolutions in the ¿/100 range.
dc.language.isoeng
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Ciències de la visió::Òptica física
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura
dc.subjectÀrees temàtiques de la UPC::Enginyeria dels materials
dc.subject.lcshOptical fiber detectors
dc.subject.lcshAtomic force microscopy
dc.subject.lcshResolution (Optics)
dc.subject.lcshNanoscience
dc.subject.lcshMeasuring instruments
dc.subject.otheroptical feedback interferometry
dc.subject.otherdisplacement measurement
dc.subject.othernanometric resolution
dc.subject.otheratomic force microscopy
dc.titleMicrocantilever Displacement Measurement Using a Mechanically Modulated Optical Feedback Interferometer
dc.typeArticle
dc.subject.lemacDetectors de fibra òptica
dc.subject.lemacMicroscòpia de força atòmica
dc.subject.lemacNanociència
dc.subject.lemacMesurament -- Instruments
dc.subject.lemacDetectors òptics
dc.contributor.groupUniversitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica
dc.identifier.doi10.3390/s16070997
dc.relation.publisherversionhttp://www.mdpi.com/1424-8220/16/7/997
dc.rights.accessOpen Access
local.identifier.drac18733270
dc.description.versionPostprint (published version)
local.citation.authorAzcona, F. J.; Jha, A.; Yañez, C.; Atashkhooei, R.; Royo, S.
local.citation.publicationNameSensors
local.citation.volume16
local.citation.number7
local.citation.startingPage997-1
local.citation.endingPage997-17
dc.identifier.pmid27367702


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