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dc.contributor.authorAndrade Miceli, Dennis Michael
dc.contributor.authorCalomarde Palomino, Antonio
dc.contributor.authorRubio Sola, Jose Antonio
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2010-09-15T11:02:51Z
dc.date.available2010-09-15T11:02:51Z
dc.date.created2010
dc.date.issued2010
dc.identifier.citationAndrade, D.; Calomarde, A.; Rubio, J. A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits. A: IEEE International Midwest Symposium on Circuits and Systems. "53rd IEEE International Midwest Symposium on Circuits and Systems". Seatle, WA: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 141-144.
dc.identifier.urihttp://hdl.handle.net/2117/8875
dc.description.abstractAbstract—Process variability and environmental fluctuations deeply affect the digital circuits performance in many different ways, one of them, the data processing time which may cause error on synchronous digital circuits due to underestimated time violations. This situation is commonly avoided adding time margins to the clock signal making it larger than nominal worstcase data process time, penalizing the global performance. In this paper a new mechanism for compensating both environmental fluctuations and process parameters variations effects on digital circuits is presented. The environmental compensation mechanism regenerates the clock signal for a pipelined system stages adding a compensated skew component depending on the local environmental conditions of every one of these stages. The process variations are corrected with a calibration circuit which adjusts the clock period in every stage taking into account its particular static deviations.
dc.format.extent4 p.
dc.language.isoeng
dc.publisherIEEE Press. Institute of Electrical and Electronics Engineers
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
dc.subject.lcshDigital integrated circuits -- Design and construction
dc.titleA comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits
dc.typeConference report
dc.subject.lemacCircuits digitals -- Disseny
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.identifier.doi10.1109/MWSCAS.2010.5548578
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
local.identifier.drac2640250
dc.description.versionPostprint (published version)
local.citation.authorAndrade, D.; Calomarde, A.; Rubio, J.
local.citation.contributorIEEE International Midwest Symposium on Circuits and Systems
local.citation.pubplaceSeatle, WA
local.citation.publicationName53rd IEEE International Midwest Symposium on Circuits and Systems
local.citation.startingPage141
local.citation.endingPage144


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