| Títol: | Turtle Logic: A new probabilistic design methodology of nanoscale digital circuits |
| Autor: | García Leyva, Lancelot
Calomarde Palomino, Antonio
Moll Echeto, Francisco de Borja
Rubio Sola, Jose Antonio |
| Altres autors/autores: | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| Editorial: | IEEE Press. Institute of Electrical and Electronics Engineers |
| Matèries: | Àrees temàtiques de la UPC::Enginyeria electrònica i telecomunicacions::Circuits electrònics
Nanoscale electronic devices
Circuits digitals -- Disseny
Nanotecnologia |
| Tipus de document: | Conference report |
| Descripció: | As devices and operating voltages are scaled down, future circuits will be plagued by higher soft error rates, reduced noise margins and defective devices. A key challenge for the
future technologies is to retain circuit reliability in the presence of faults and noise. The Turtle Logic (TL) is a new probabilistic logic method based on port redundancy and complementary data, oriented to emerging and beyond CMOS technologies. The TL is a technology independent method, which aims to improve tolerance to errors due to noise in single gates, logic blocks or
functional units. The TL operation is based on the consistency relation of redundant inputs. In case of discrepancy, the output
of the system keeps the previous value, therefore avoiding the propagation of incorrect inputs. Simulations show an excellent performance of TL in the presence of large random noise at the inputs, as well as intrinsic noise (thermal noise and flicker noise) and shot noise in the power source. |
| Altres identificadors i accés: | García, L. [et al.]. Turtle Logic: A new probabilistic design methodology of nanoscale digital circuits. A: IEEE international Midwest Symposium on Circuits and Systems. "53rd IEEE international Midwest Symposium on Circuits and Systems". Seattle, WA,: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 1101-1104.
http://hdl.handle.net/2117/8873
10.1109/MWSCAS.2010.5548845 |
| Disponible al dipòsit: | E-prints UPC
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