Mostra el registre d'ítem simple

dc.contributor.authorVall-Llossera Ferran, Mercedes Magdalena
dc.contributor.authorDuffo Ubeda, Núria
dc.contributor.authorCamps Carmona, Adriano José
dc.contributor.authorCorbella Sanahuja, Ignasi
dc.contributor.authorBará Temes, Francisco Javier
dc.contributor.authorTorres Torres, Francisco
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2016-07-06T13:26:55Z
dc.date.available2016-07-06T13:26:55Z
dc.date.issued2000
dc.identifier.citationVall-llossera, M., Duffo, N., Camps, A., Corbella, I., Bara, F., Torres, F. Method of moments applied to the analysis of rough surfaces modelled by fractals. A: European Congress on Computational Methods in Applied Sciences and Engineering. "ECCOMAS 2000: European Congress on Computational Methods in Applied Sciences and Engineering: Barcelona: 11 - 14 September 2000; incorporating the VI International Conference on Computational Plasticity (COMPLAS VI)". Barcelona: 2000, p. 1-9.
dc.identifier.urihttp://hdl.handle.net/2117/88555
dc.description.abstractThe Scattering and Emissivity of rough surfaces involve solutions to non-linear differential equations. Different approaches have been used in the literature to obtain approximate solutions under some hypothesis. For example Kirchhoff solution is used when the roughness is gentle on the scale of the wavelength. In this paper the Method of Moments is used to analyze the scattering of arbitrary surfaces. No approximation about the scale roughness is necessary. Both Gaussian and Fractal surfaces have been modeled and compared. The introduction of fractal geometry provides a new tool to describe natural rough surfaces. A first inside to the properties and parameters that describe fractal geometry has been done in order to characterize them statistically. It has been demonstrated that geometrical and scattering characteristics are controlled by Fractal descriptors, including fractal dimension. As a first step, our simulations refer to a (topological) one-dimensional (1-D) profile embedded in a two-dimensional (2-D) space. Physically, this corresponds to assume that both the electromagnetic field and the surface height are constant along a fixed direction. Extension to the case of a 2-D surface embedded in a three-dimensional (3-D) space is not conceptually difficult, but any simulation run requires a much longer computational time. Furthermore, scattering results obtained for 1-D profiles give also a good indication of scattering dependence on 2-D surface parameters.
dc.format.extent9 p.
dc.language.isoeng
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació
dc.subject.lcshFractals
dc.subject.lcshScattering (Physics)
dc.subject.otherMethod of moments
dc.subject.otherScattering
dc.subject.otherRough surfaces
dc.subject.otherFractals
dc.titleMethod of moments applied to the analysis of rough surfaces modelled by fractals
dc.typeConference report
dc.subject.lemacFractals
dc.subject.lemacDispersió (Física)
dc.contributor.groupUniversitat Politècnica de Catalunya. RSLAB - Grup de Recerca en Teledetecció
dc.contributor.groupUniversitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
local.identifier.drac2353073
dc.description.versionPostprint (published version)
local.citation.authorVall-llossera, M.; Duffo, N.; Camps, A.; Corbella, I.; Bara, F.; Torres, F.
local.citation.contributorEuropean Congress on Computational Methods in Applied Sciences and Engineering
local.citation.pubplaceBarcelona
local.citation.publicationNameECCOMAS 2000: European Congress on Computational Methods in Applied Sciences and Engineering: Barcelona: 11 - 14 September 2000; incorporating the VI International Conference on Computational Plasticity (COMPLAS VI)
local.citation.startingPage1
local.citation.endingPage9


Fitxers d'aquest items

Thumbnail

Aquest ítem apareix a les col·leccions següents

Mostra el registre d'ítem simple