Requirements for noise parameter measurements in superconducting electronic systems
Document typeConference report
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessOpen Access
General considerations on the measurement of noise parameters in highly mismatched systems are discussed. In particular, the problem of noise characterization of active superconducting microwave devices is addressed. A measurement technique that includes an error analysis is presented along with current data for a superconducting flux flow transistor.
CitationO'callaghan, J. Requirements for noise parameter measurements in superconducting electronic systems. A: IEEE MTT-S International Microwave Symposium. "1991 IEEE MTT-S International Microwave Symposium digest : June, 10-14, 1991, Boston, Massachusett". Boston, Massachusetts: Institute of Electrical and Electronics Engineers (IEEE), 1991, p. 237-240.