Direct extraction of all four transistor noise parameters from 50 noise figure measurements
PublisherInstitution of Electrical Engineers
Rights accessOpen Access
A new method for measuring the four noise parameters (NPs) of a transistor is presented. It is based on the determination of its intrinsic noise matrix elements (C, ,INT, C,,7NT, Re(C,,
CitationLazaro, A., Pradell, L., Beltrán, A., O'callaghan, J. Direct extraction of all four transistor noise parameters from 50 noise figure measurements. "Electronics Letters", Febrer 1998, vol. 34, núm. 3, p. 289-291.