EditorInstitute of Electrical and Electronics Engineers (IEEE)
Condicions d'accésAccés obert
In this paper, the design of a Microstrip Test Fixture for TRL calibration is described. Experimental results for S-parameters measurement of a GaAs FET chip in the 3-22 GHz frequency range are presented. Repeatability of connections and measurements is discussed and experimental results are also presented.
CitacióPradell, L., Artal, E., Sabater, C. S-parameter measurement of chip Ga As FETs up to 22 GHz using the TRL calibration technique. A: European Microwave Conference. "Conference proceedings, 19th European Microwave Conference Monday 4th to Thursday 7th September 1989, Wembley Conference Centre, London, United Kingdom". London: Institute of Electrical and Electronics Engineers (IEEE), 1989, p. 576-581.