SINR profile for spectral efficiency optimization of SIC receivers in the many-user regime
Tipus de documentComunicació de congrés
EditorInstitute of Electrical and Electronics Engineers (IEEE)
Condicions d'accésAccés restringit per política de l'editorial
In dense wireless scenarios, and particularly under high traffic loads, the design of efficient random access protocols is necessary. Some candidate solutions are based on Direct- Sequence Spread Spectrum (DS-SS) combined with a Successive Interference Cancellation (SIC) demodulator, but the perfor- mance of these techniques is highly related to the distribution of the users received power. In that context, this paper presents a theoretical analysis to calculate the optimum user SINR profile at the decoder maximizing the spectral efficiency in bps/Hz for a specific modulation and practical Forward Error Correction (FEC) code. This solution is achieved by means of Variational Calculus operating in the asymptotic large-user case. Although a constant SINR function has been typically assumed in the literature (the one maximizing capacity), the theoretical results evidence that the optimum SINR profile must be an increasing function of the users received power. Its performance is compared with that of the uniform profile for two representative scenarios with different channel codes in a slightly overloaded system. The numerical results show that the optimum solution regulates the network load preventing the aggregate throughput from collapsing when the system is overloaded. In scenarios with a large number of transmitters, this optimum solution can be implemented in an uncoordinated manner with the knowledge of a few public system parameters.
CitacióSala, J., Villares, J., Rey, F. SINR profile for spectral efficiency optimization of SIC receivers in the many-user regime. A: IEEE International Conference on Communications. "2015 ICC - 2015 IEEE International Conference on Communication Workshop: London, United Kingdom: 8-12 June 2015". Londres: Institute of Electrical and Electronics Engineers (IEEE), 2015, p. 2063-2068.
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