Mostra el registre d'ítem simple
Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements
dc.contributor.author | Aldrete Vidrio, Eduardo |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Amine Salhi, M. |
dc.contributor.author | Grauby, Stéphane |
dc.contributor.author | Dilhaire, Stefan |
dc.contributor.author | Onabajo, M. |
dc.contributor.author | Silva-Martínez, José |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2010-07-21T13:47:52Z |
dc.date.available | 2010-07-21T13:47:52Z |
dc.date.created | 2010-06-08 |
dc.date.issued | 2010-06-08 |
dc.identifier.citation | Aldrete, E. [et al.]. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements. "Measurement science and technology", 08 Juny 2010, vol. 21, núm. 7, p. 1-10. |
dc.identifier.issn | 0957-0233 |
dc.identifier.uri | http://hdl.handle.net/2117/8325 |
dc.description.abstract | This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and discussed with regard to the respective trade-offs associated with practical off-chip methodologies as well as on-chip measurement scenarios. Strategies are defined to extract the center frequency and 1 dB compression point of a narrow-band LNA operating around 1 GHz. The proposed techniques are experimentally demonstrated using a compact and efficient on-chip temperature sensor for built-in test purposes that has a power consumption of 15 μW and a layout area of 0.005 mm2 in a 0.25 μm CMOS technology. Validating results from off-chip interferometer-based temperature measurements and conventional electrical characterization results are compared with the on-chip measurements, showing the capability of the techniques to estimate the center frequency and 1 dB compression point of the LNA with errors of approximately 6% and 0.5 dB, respectively. |
dc.format.extent | 10 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Integrated circuits |
dc.subject.lcsh | Low noise amplifiers |
dc.title | Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements |
dc.type | Article |
dc.subject.lemac | Electrònica |
dc.subject.lemac | Circuits integrats |
dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.identifier.doi | 10.1088/0957-0233/21/7/075104 |
dc.relation.publisherversion | http://iopscience.iop.org/0957-0233/21/7/075104/pdf/0957-0233_21_7_075104.pdf |
dc.rights.access | Open Access |
local.identifier.drac | 2588958 |
dc.description.version | Postprint (published version) |
local.citation.author | Aldrete, E.; Mateo, D.; Altet, J.; Amine, M.; Grauby, S.; Dilhaire, S.; Onabajo, M.; Silva, J. |
local.citation.publicationName | Measurement science and technology |
local.citation.volume | 21 |
local.citation.number | 7 |
local.citation.startingPage | 1 |
local.citation.endingPage | 10 |
Fitxers d'aquest items
Aquest ítem apareix a les col·leccions següents
-
Articles de revista [92]
-
Articles de revista [1.728]