Enviaments recents

  • Improving indirect test efficiency using multi-directional tessellations in the measure space 

    Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2016)
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    Indirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever increasing device verification costs. This work explores the ...
  • RRAM based cell for hardware security applications 

    Arumi Delgado, Daniel; Manich Bou, Salvador; Rodríguez Montañés, Rosa (2016)
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    Resistive random access memories (RRAMs)have arisen as a competitive candidate for non-volatile memories due to their scalability, simple structure, fast switching speed and compatibility with conventional back-end processes. ...
  • Backside polishing detector: a new protection against backside attacks 

    Manich Bou, Salvador; Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Mujal Colell, Jordi; Hernández García, David (2015)
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    Secure chips are in permanent risk of attacks. Physical attacks usually start removing part of the package and accessing the dice by different means: laser shots, electrical or electromagnetic probes, etc. Doing this ...
  • Mixed-signal test band guarding using digitally coded indirect measurements 

    Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
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    Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ...
  • Power-aware voltage tuning for STT-MRAM reliability 

    Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Di Carlo, Stefano; Renovell, Michel; Prinetto, Paolo; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
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    One of the most promising emerging memory technologies is the Spin-Transfer-Torque Magnetic Random Access Memory (STT-MRAM), due to its high speed, high endurance, low area, low power consumption, and good scaling capability. ...
  • Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell 

    Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Indaco, Marco; Renovell, Michel; Prinetto, Paolo; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
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    The rapid development of low power, high density, high performance SoCs has pushed the embedded memories to their limits and opened the field to the development of emerging memory technologies. The Spin- Transfer-Torque ...
  • STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations 

    Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Indaco, Marco; Prinetto, Paolo; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
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    The CMOS based memories are facing major issues with technology scaling, such as decreased reliability and increased leakage power. A point will be reached when the technology scaling issues will overweight the benefits. ...
  • Defeating simple power analysis attacks in cache memories 

    Neagu, Madalin; Manich Bou, Salvador; Miclea, Liviu (Institute of Electrical and Electronics Engineers (IEEE), 2015)
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    A wide range of attacks that target cache memories in secure systems have been reported in the last half decade. Cold-boot attacks can be thwarted through the recently proposed Interleaved Scrambling Technique (IST). ...
  • Analog circuits testing using digitally coded indirect measurements 

    Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
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    Testing mixed-signal circuits is a challenging task requiring high amounts of human and technical resources. To overcome these drawbacks, indirect testing methods have been adopted as an efficient solution to perform ...
  • Resistive open defect characteritzation in 3D 6T SRAM memories 

    Castillo, Raúl; Arumi Delgado, Daniel; Rodríguez Montañés, Rosa (2014)
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    The relentless decrease in feature size and the increase of density requirements in Integrated Circuit (IC) manufacturing arise new challenges that must be overcome. One of the most promising alternatives is three-dimensional ...

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