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More sophisticated material inspection methods are requiring a better and more
accurate visualization and characterization of materials. So far, most of the material
visualization methods are 2D projections.
A recent 3D FIB (Focused Ion Beam) tomography method has been developed to observe materials in a
micro-scale and is used to reconstruct the whole 3D microstructure of the material, which other 2D
observation methods can not achieve.
Once the 3D microstructure is obtained, it can be used for further finite element calculation and
analysis, which will help us understand better and predict the properties and behaviors of the
material from a micro-scale viewpoint. It can thus correct the mathematical modules for
In this project, the 3D microstructure is reconstructed based on FIB tomography and finite element
analysis is carried out based on the FE model of the 3D microstructure.
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