This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
CitationAldrete, H. [et al.]. Non-invasive RF built-in testing using on-chip temperature sensors. A: 2009 International Test Conference (ITC). "2009 International Test Conference". Austin, Texas: IEEE Computer Society Publications, 2009, p. 1-4.
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