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Extraction of noise parameters of transistor using a spectrum analyser and 50^ noise figure measurements only.
| dc.contributor.author | Lázaro Guillén, Antoni |
| dc.contributor.author | Pradell i Cara, Lluís |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
| dc.date.accessioned | 2007-03-26T15:35:54Z |
| dc.date.available | 2007-03-26T15:35:54Z |
| dc.date.created | 1998-11-26 |
| dc.date.issued | 1998-11-26 |
| dc.identifier.citation | Lazaro, A.; Pradell, L. Extraction of noise parameters of transistor using a spectrum analyser and 50 Θ noise figure measurements only. Electronics Letters, 1998, 34 (24): 2353-2354. ISSN:0013-5194 |
| dc.identifier.issn | 0013-5194 |
| dc.identifier.uri | http://hdl.handle.net/2117/718 |
| dc.description.abstract | A method for measuring the four noise parameters of a transistor in the microwave range using a configuration based on a conventional spectrum analyser is presented. In contrast to previous methods, it requires wideband 50 Θ noise-figure measurements only. The method features an accuracy similar to that of noise figure meters at a much higher measurement speed and lower cost. |
| dc.format.extent | 2353-2354 |
| dc.language.iso | eng |
| dc.publisher | IEE |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
| dc.subject.lcsh | Microwave transistors |
| dc.subject.other | electric noise measurement |
| dc.subject.other | microwave measurement |
| dc.subject.other | microwave transistors |
| dc.subject.other | spectral analysers |
| dc.subject.other | semiconductor device measurement |
| dc.title | Extraction of noise parameters of transistor using a spectrum analyser and 50^ noise figure measurements only. |
| dc.type | Article |
| dc.subject.lemac | Microones -- Transistors |
| dc.contributor.group | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
| dc.description.peerreviewed | Peer Reviewed |
| dc.rights.access | Open Access |
| local.personalitzacitacio | true |
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