A method for measuring the four noise parameters of a transistor in the microwave range using a configuration based on a conventional spectrum analyser is presented. In contrast to previous methods, it requires wideband 50 Θ noise-figure measurements only. The method features an accuracy similar to that of noise figure meters at a much higher measurement speed and lower cost.
CitationLazaro, A.; Pradell, L. Extraction of noise parameters of transistor using a spectrum analyser and 50 Θ noise figure measurements only. Electronics Letters, 1998, 34 (24): 2353-2354. ISSN:0013-5194
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