CitationFernandez, R. [et al.]. Experimental Characterization of NBTI Effect on pMOSFET and CMOS Inverter. A: Conference on Electron Devices. "7th Spanish conference on Electron Devices (CDE 2009)". Santiago de Compostela: 2009.
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder. If you wish to make any use of the work not provided for in the law, please contact: firstname.lastname@example.org