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  Non-invasive RF built-in testing using on-chip temperature sensors 

  Aldrete Vidrio, Héctor; Onabajo, M.; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José (IEEE Computer Society Publications, 2009-11)
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  This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.