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The method is based on the modification of bus connectivity to force bus oscillation during testing. The oscillation frequency depends on the open resistance and location on the line. Comparison of the frequency with a reference allows the detection and eventual location of the defect. Electrical
simulations and preliminary experiments on a test chip show the detection capabilities and the feasibility of the proposed method.
CitationRius, J. A Method for Detecting Resistive Opens in Buses. A: IEEE International On-Line Testing Symposium. "IOLTS: proceedings of the 16th IEEE International On-Line Testing Symposium". Corfú: 2010, p. 187-189.
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