PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessRestricted access - publisher's policy
This paper presents an Intellectual Property (IP) module that includes fully functional autonomous Automatic Test Equipment (ATE). The module analyses responses from the Device Under Test (DUT) after sending test vectors to the device. Communication with the DUT is maintained through a synchronous bidirectional serial channel. The module has been designed for a fail-safe level of security, which means any single fault producing an erroneous output is detected. Several IP-ATEs can be synthesized in a single hardware platform to operate independently or coordinately.
CitationFransi, S. [et al.]. Design and implementation of automatic test equipment IP module. A: IEEE European Test Symposium. "15th IEEE European Test Symposium: 24-28 May 2010: ETS 2010, Praga : digest of papers". Praga: Institute of Electrical and Electronics Engineers (IEEE), 2010, p. 244.
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