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FinFET and III-V/Ge technology impact on 3T1D cell behavior
| dc.contributor.author | Amat Bertran, Esteve |
| dc.contributor.author | Calomarde Palomino, Antonio |
| dc.contributor.author | Almudever, Carmen G. |
| dc.contributor.author | Aymerich Capdevila, Nivard |
| dc.contributor.author | Canal Corretger, Ramon |
| dc.contributor.author | Rubio Sola, Jose Antonio |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria de Sistemes, Automàtica i Informàtica Industrial |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Arquitectura de Computadors |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2015-03-03T16:49:41Z |
| dc.date.available | 2015-03-03T16:49:41Z |
| dc.date.created | 2013 |
| dc.date.issued | 2013 |
| dc.identifier.citation | Amat, Esteve [et al.]. FinFET and III-V/Ge technology impact on 3T1D cell behavior. A: Intel Ireland Research Conference. "Intel Ireland Research Conference". 2013. |
| dc.identifier.uri | http://hdl.handle.net/2117/26567 |
| dc.description.abstract | In this work, we assess the performance of a ring oscillator and a DRAM cell when they are implemented with different technologies (planar CMOS, FinFET and III-V MOSFETs), and subjected to different reliability scenarios (variability and soft errors). FinFET-based circuits show the highest robustness against variability and soft error environments. |
| dc.language.iso | eng |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.subject.lcsh | Electronic circuits |
| dc.title | FinFET and III-V/Ge technology impact on 3T1D cell behavior |
| dc.type | Conference lecture |
| dc.subject.lemac | Circuits electrònics |
| dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
| dc.contributor.group | Universitat Politècnica de Catalunya. ARCO - Microarquitectura i Compiladors |
| dc.description.peerreviewed | Peer Reviewed |
| dc.rights.access | Open Access |
| local.identifier.drac | 15375136 |
| dc.description.version | Postprint (published version) |
| local.citation.author | Amat, Esteve; Calomarde, A.; Almudever, C.G.; Aymerich, N.; Canal, R.; Rubio, A. |
| local.citation.contributor | Intel Ireland Research Conference |
| local.citation.publicationName | Intel Ireland Research Conference |
