Beam focalization in reflection from flat dielectric subwavelength gratings
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We experimentally demonstrate the recently predicted effect of near-field focusing for light beams from flat dielectric subwavelength gratings (SWGs). This SWGs were designed for visible light 532 nm and fabricated by direct laser writing in a negative photoresist, with the refractive index n = 1.5 and the period d = 314 nm. The laterally invariant gratings can focus light beams without any optical axis to achieve the transversal invariance. We show that focal distances can be obtained up to 13 mu m at normal reflection for TE polarization.
CitationCheng, Y. [et al.]. Beam focalization in reflection from flat dielectric subwavelength gratings. "Optics letters", 15 Octubre 2014, vol. 39, núm. 20, p. 6086-6089.
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