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Use of reference limits in the Feature Selective Validation (FSV) method
dc.contributor.author | Jauregui Telleria, Ricardo Ignacio |
dc.contributor.author | Pous Solà, Marc |
dc.contributor.author | Silva Martínez, Fernando |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2014-11-19T14:17:47Z |
dc.date.created | 2014 |
dc.date.issued | 2014 |
dc.identifier.citation | Jaúregui, R.I.; Pous, M.; Silva, F. Use of reference limits in the Feature Selective Validation (FSV) method. A: International Symposium on Electromagnetic Compatibility. "2014 International Symposium on Electromagnetic Compatibility: September 1-4, 2014: Gothenburg, Sweden". Gotheborg: Institute of Electrical and Electronics Engineers (IEEE), 2014, p. 1031-1036. |
dc.identifier.isbn | 978-1-4799-3226-9 |
dc.identifier.uri | http://hdl.handle.net/2117/24758 |
dc.description.abstract | This paper presents a method for taking into account reference limits when the Feature Selective method (FSV) is applied. Nowadays, there is a long line of research that underlines the important role played by the FSV to perform an objective validation process. However, until now, there has been no consideration of a reference level in the validation process. This paper presents a methodology to calculate the FSV values when a reference limit is contemplated. We demonstrate the importance of this technique in the validation criteria for the Computational Electromagnetics and, more particularly, in the EMC comparison process. Finally, in order to show the application and the importance of the method, two real cases, considering different reference levels, are analysed. |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Física::Electromagnetisme |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica |
dc.subject.lcsh | Electromagnetic compatibility |
dc.subject.lcsh | Computer simulation |
dc.subject.other | Computational Electromagnetics (CEM) |
dc.subject.other | Computer simulation |
dc.subject.other | Data comparison |
dc.subject.other | Feature Selective Validation method (FSV) |
dc.subject.other | Numerical simulation |
dc.subject.other | Validation |
dc.subject.other | Reference limits |
dc.title | Use of reference limits in the Feature Selective Validation (FSV) method |
dc.type | Conference report |
dc.subject.lemac | Compatibilitat electromagnètica |
dc.subject.lemac | Simulació per ordinador |
dc.contributor.group | Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica |
dc.identifier.doi | 10.1109/EMCEurope.2014.6931054 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6931054 |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 15285181 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Jaúregui, R.I.; Pous, M.; Silva, F. |
local.citation.contributor | International Symposium on Electromagnetic Compatibility |
local.citation.pubplace | Gotheborg |
local.citation.publicationName | 2014 International Symposium on Electromagnetic Compatibility: September 1-4, 2014: Gothenburg, Sweden |
local.citation.startingPage | 1031 |
local.citation.endingPage | 1036 |