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dc.contributor.authorJauregui Telleria, Ricardo Ignacio
dc.contributor.authorPous Solà, Marc
dc.contributor.authorSilva Martínez, Fernando
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2014-11-19T14:17:47Z
dc.date.created2014
dc.date.issued2014
dc.identifier.citationJaúregui, R.I.; Pous, M.; Silva, F. Use of reference limits in the Feature Selective Validation (FSV) method. A: International Symposium on Electromagnetic Compatibility. "2014 International Symposium on Electromagnetic Compatibility: September 1-4, 2014: Gothenburg, Sweden". Gotheborg: Institute of Electrical and Electronics Engineers (IEEE), 2014, p. 1031-1036.
dc.identifier.isbn978-1-4799-3226-9
dc.identifier.urihttp://hdl.handle.net/2117/24758
dc.description.abstractThis paper presents a method for taking into account reference limits when the Feature Selective method (FSV) is applied. Nowadays, there is a long line of research that underlines the important role played by the FSV to perform an objective validation process. However, until now, there has been no consideration of a reference level in the validation process. This paper presents a methodology to calculate the FSV values when a reference limit is contemplated. We demonstrate the importance of this technique in the validation criteria for the Computational Electromagnetics and, more particularly, in the EMC comparison process. Finally, in order to show the application and the importance of the method, two real cases, considering different reference levels, are analysed.
dc.format.extent6 p.
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Física::Electromagnetisme
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica
dc.subject.lcshElectromagnetic compatibility
dc.subject.lcshComputer simulation
dc.subject.otherComputational Electromagnetics (CEM)
dc.subject.otherComputer simulation
dc.subject.otherData comparison
dc.subject.otherFeature Selective Validation method (FSV)
dc.subject.otherNumerical simulation
dc.subject.otherValidation
dc.subject.otherReference limits
dc.titleUse of reference limits in the Feature Selective Validation (FSV) method
dc.typeConference report
dc.subject.lemacCompatibilitat electromagnètica
dc.subject.lemacSimulació per ordinador
dc.contributor.groupUniversitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
dc.identifier.doi10.1109/EMCEurope.2014.6931054
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6931054
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac15285181
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorJaúregui, R.I.; Pous, M.; Silva, F.
local.citation.contributorInternational Symposium on Electromagnetic Compatibility
local.citation.pubplaceGotheborg
local.citation.publicationName2014 International Symposium on Electromagnetic Compatibility: September 1-4, 2014: Gothenburg, Sweden
local.citation.startingPage1031
local.citation.endingPage1036


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