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Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Aldrete Vidrio, Héctor |
dc.contributor.author | Reverter Cubarsí, Ferran |
dc.contributor.author | Gómez Salinas, Dídac |
dc.contributor.author | Gonzalez Jimenez, J. L. |
dc.contributor.author | Onabajo, Marvin |
dc.contributor.author | Silva Martinez, Jose |
dc.contributor.author | Martineau, B. |
dc.contributor.author | Perpiñà Gilabet, Xavier |
dc.contributor.author | Abdallah, Louay |
dc.contributor.author | Stratigopoulos, Haralampos-G. |
dc.contributor.author | Aragonès Cervera, Xavier |
dc.contributor.author | Jordà, Xavier |
dc.contributor.author | Vellvehi, Miquel |
dc.contributor.author | Dilhaire, Stefan |
dc.contributor.author | Mir, Salvador |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2014-11-12T14:39:56Z |
dc.date.created | 2014 |
dc.date.issued | 2014 |
dc.identifier.citation | Altet, J. [et al.]. Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes. A: IEEE International Midwest Symposium on Circuits and Systems. "2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS): August 3-6, 2014: College Station, Texas". Texas: Institute of Electrical and Electronics Engineers (IEEE), 2014, p. 1081-1084. |
dc.identifier.isbn | 978-1-4799-4134-6 |
dc.identifier.uri | http://hdl.handle.net/2117/24703 |
dc.description.abstract | This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. The strategy is to embed small temperature sensors on the same silicon die as the circuit under test, taking advantage of empty spaces in the layout. This paper reviews the physical principles, and presents examples that reveal how temperature sensors can be used as functional built-in testers serving to reduce testing costs and enhance yield as part of self-healing strategies. |
dc.format.extent | 4 p. |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors |
dc.subject.lcsh | Power amplifiers |
dc.subject.lcsh | Temperature measuring instruments |
dc.subject.other | Built-in self test |
dc.subject.other | Calibration |
dc.subject.other | Circuit testing |
dc.subject.other | Elemental semiconductors |
dc.subject.other | Millimetre wave circuits |
dc.subject.other | Silicon |
dc.subject.other | Temperature sensors |
dc.title | Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes |
dc.type | Conference report |
dc.subject.lemac | Amplificadors de potència |
dc.subject.lemac | Termometria -- Aparells i instruments |
dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.group | Universitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics |
dc.identifier.doi | 10.1109/MWSCAS.2014.6908606 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6908606 |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 15177859 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Altet, J.; Aldrete, H.E.; Reverter, F.; Gómez, D.; Gonzalez, J.L.; Onabajo, M.; Silva, J.; Martineau, B.; Perpiñà, X.; Abdallah, L.; Stratigopoulos, H.; Aragones, X.; Jordà, X.; Vellvehi, M.; Dilhaire, S.; Mir, S.; Mateo, D. |
local.citation.contributor | IEEE International Midwest Symposium on Circuits and Systems |
local.citation.pubplace | Texas |
local.citation.publicationName | 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS): August 3-6, 2014: College Station, Texas |
local.citation.startingPage | 1081 |
local.citation.endingPage | 1084 |