Mostra el registre d'ítem simple
Improving availability bounds using the failure distance concept
dc.contributor.author | Carrasco, Juan A. |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2014-07-02T11:53:47Z |
dc.date.available | 2014-07-03T06:00:45Z |
dc.date.created | 1994 |
dc.date.issued | 1994 |
dc.identifier.citation | Carrasco, J. Improving availability bounds using the failure distance concept. A: IFIP Working Conferences on Dependable Computing for Critical Applications. "Dependable computing for critical applications 4: [presented at the Fourth International IFIP Working Conference on Dependable Computing for Critical Applications held in San Diego, California on January 4 - 6, 1994]". Springer, 1994, p. 479-497. |
dc.identifier.isbn | 978-3-7091-9398-3 |
dc.identifier.uri | http://hdl.handle.net/2117/23388 |
dc.description.abstract | Continuous-time Markov chains are commonly used for dependability modeling of repairable fault-tolerant computer systems. Realistic models of non-trivial fault-tolerant systems easily have very large state spaces. An attractive approach which has been proposed to deal with the largeness problem is the use of pruning-based methods which provide error bounds. Using results from Courtois and Semal, a method for bounding the steady-state availability has been recently developed by Muntz, de Souza e Silva, and Goyal. This paper presents a new method based on a different approach which exploits the concept of failure distance to better bound the behavior out of the non-generated state space. The proposed method yields tighter bounds. Numerical analysis shows that the improvement is typically significant. |
dc.format.extent | 19 p. |
dc.language.iso | eng |
dc.publisher | Springer |
dc.subject | Àrees temàtiques de la UPC::Informàtica::Sistemes d'informació |
dc.subject | Àrees temàtiques de la UPC::Matemàtiques i estadística::Probabilitat |
dc.subject.lcsh | Markov processes |
dc.title | Improving availability bounds using the failure distance concept |
dc.type | Conference lecture |
dc.subject.lemac | Markov, Processos de |
dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.rights.access | Open Access |
local.identifier.drac | 2558984 |
dc.description.version | Postprint (published version) |
local.citation.author | Carrasco, J. |
local.citation.contributor | IFIP Working Conferences on Dependable Computing for Critical Applications |
local.citation.publicationName | Dependable computing for critical applications 4: [presented at the Fourth International IFIP Working Conference on Dependable Computing for Critical Applications held in San Diego, California on January 4 - 6, 1994] |
local.citation.startingPage | 479 |
local.citation.endingPage | 497 |