This paper presents a new importance sampling scheme called failure biasing for the efficient simulation of Markovian models of repairable fault-tolerant systems. The new scheme enriches the failure biasing scheme previously proposed by exploiting the concept of failure distance. This results in a much more efficient simulation with speedups over failure biasing of orders of magnitude in typical cases. The paper also discusses the efficient implementation of the new importance sampling scheme and presents a practical method for the optimization of the biasing parameters.
CitationCarrasco, J. Failure distance-based simulation of repairable fault-tolerant systems. A: International Conference on Modelling Techniques and Tools for Computer Performance Evaluation. "Computer performance evaluation: modelling techniques and tools: proceedings of the Fifth International Conference on Modelling Techniques and Tools for Computer Performance Evaluation, Torino, Italy, 13-15 February 1991". Torino: Elsevier, 1991, p. 351-365.
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