Mostra el registre d'ítem simple

dc.contributor.authorBialasiewicz, Jan T.
dc.contributor.authorGonzález Díez, David
dc.contributor.authorBalcells Sendra, Josep
dc.contributor.authorGago Barrio, Javier
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2014-04-28T10:15:10Z
dc.date.available2014-04-28T10:15:10Z
dc.date.created2013-10-07
dc.date.issued2013-10-07
dc.identifier.citationBialasiewicz, J. [et al.]. Wavelet-based approach to evaluation of signal integrity. "IEEE transactions on industrial electronics", 07 Octubre 2013, vol. 60, núm. 10, p. 4590-4598.
dc.identifier.issn0278-0046
dc.identifier.urihttp://hdl.handle.net/2117/22719
dc.description.abstractIn this paper, we present a new approach to evaluation of signal integrity that is based on signal energy density as a function of time and frequency, represented by its wavelet scalogram. Using signal integrity ratio and cumulative energy ratio, we illustrate signal integrity analysis with simulated examples, followed by the demonstration of their usefulness through analysis of experimental data of a real audio amplifier. These figures of merit represent the extent to which the integrity of a signal is diminished by the electromagnetic interference effects and/or nonlinear processes.
dc.format.extent9 p.
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.subjectÀrees temàtiques de la UPC::Física::Electromagnetisme
dc.subject.lcshElectromagnetic interference
dc.subject.lcshSignal processing
dc.subject.lcshElectromagnetic waves
dc.subject.otherBandwidth Continuous wavelet transforms Electromagnetic interference Time frequency analysis Wavelet analysis
dc.titleWavelet-based approach to evaluation of signal integrity
dc.typeArticle
dc.subject.lemacInterferència electromagnètica
dc.subject.lemacTractament del senyal
dc.subject.lemacOnes electromagnètiques
dc.contributor.groupUniversitat Politècnica de Catalunya. (TIEG) - Terrassa Industrial Electronics Group
dc.identifier.doi10.1109/TIE.2012.2217713
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6296704&refinements%3D4294967269%2C4291944822%2C4291944246%2C4281165300%26ranges%3D2013_2014_p_Publication_Year%26matchBoolean%3Dtrue%26searchField%3DSearch_All%26queryText%3D%28p_Authors%3AGonzalez%2C+D%29
dc.rights.accessOpen Access
local.identifier.drac13434528
dc.description.versionPostprint (author’s final draft)
local.citation.authorBialasiewicz, J.; Gonzalez, D.; Balcells, J.; Gago, J.
local.citation.publicationNameIEEE transactions on industrial electronics
local.citation.volume60
local.citation.number10
local.citation.startingPage4590
local.citation.endingPage4598


Fitxers d'aquest items

Thumbnail

Aquest ítem apareix a les col·leccions següents

Mostra el registre d'ítem simple