Mostra el registre d'ítem simple
Differential optical feedback interferometry for the measurement of nanometric displacements
dc.contributor.author | Azcona Guerrero, Francisco Javier |
dc.contributor.author | Atashkhooei, Reza |
dc.contributor.author | Royo Royo, Santiago |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Òptica i Optometria |
dc.date.accessioned | 2014-04-11T11:49:32Z |
dc.date.available | 2014-04-11T11:49:32Z |
dc.date.created | 2014 |
dc.date.issued | 2014 |
dc.identifier.citation | Azcona, F.; Atashkhooei, R.; Royo, S. Differential optical feedback interferometry for the measurement of nanometric displacements. "Óptica pura y aplicada", 2014, vol. 47, núm. 1, p. 19-25. |
dc.identifier.issn | 0030-3917 |
dc.identifier.uri | http://hdl.handle.net/2117/22614 |
dc.description.abstract | We have recently proposed differential optical feedback interferometry as a convenient method to measure nanometric displacements. In this paper, we present experimental results to support the proposed method. The acquisition system (in particular the conditioning electronics), and, the signal processing algorithm applied to the captured signal, will be described. Obtained results show good agreement with measurements performed using a capacitive sensor employed as reference. © Sociedad Española de Óptica. |
dc.format.extent | 7 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Ciències de la visió::Òptica física |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Optoelectrònica |
dc.subject.lcsh | Laser interferometry |
dc.subject.lcsh | Nanotechnology |
dc.subject.other | Differential measurements |
dc.subject.other | High resolution |
dc.subject.other | Nanometric displacements |
dc.subject.other | Nanotechnology |
dc.subject.other | Optical feedback interferometry |
dc.title | Differential optical feedback interferometry for the measurement of nanometric displacements |
dc.type | Article |
dc.subject.lemac | Interferometria làser |
dc.subject.lemac | Nanotecnologia |
dc.contributor.group | Universitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica |
dc.identifier.doi | 10.7149/OPA.47.1.19 |
dc.rights.access | Open Access |
local.identifier.drac | 14003449 |
dc.description.version | Postprint (published version) |
local.citation.author | Azcona, F.; Atashkhooei, R.; Royo, S. |
local.citation.publicationName | Óptica pura y aplicada |
local.citation.volume | 47 |
local.citation.number | 1 |
local.citation.startingPage | 19 |
local.citation.endingPage | 25 |
Fitxers d'aquest items
Aquest ítem apareix a les col·leccions següents
-
Articles de revista [149]
-
Articles de revista [447]