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In this paper, the characterization of the EMC conducted emissions of integrated circuits under different temperature stress condition, up to 3 GHz is presented. The impact of high temperature has been measured on the input impedance of propagation paths of the electromagnetic conducted emissions, as well as on the electromagnetic noise of a clock generator.
CitationBerbel, N.; Fernandez, R.; Gil, I. Characterization of conducted emission at high frequency under different temperature. A: International Workshop on Electromagnetic Compatibility of Integrated Circuits. "Proceedings of EMC COMPO 2013". Nara: 2013.
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