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Testing M-S circuits is a difficult task demanding high amount of resources. To overcome these drawbacks, indirect
testing methods have been adopted as an efficient solution to perform specification based tests using easy to measure metrics.
In this work, a testing technique using octrees in the measure space is presented. Octrees have been used in computer graphics
with successful results for rendering, image processing and space clustering applications. In this paper are used to encode the test acceptance region with arbitrary precision after an statistical
training phase. Such representation allows an efficient way to test a candidate circuit in terms of test application time. The method
is applied to test a Biquad filter with encouraging results. Test escapes and test yield loss caused by parametric variations have been estimated.
CitacióÁlvaro Gómez-Pau; Balado, L.; Figueras, J. M-S test based on specification validation using octrees in the measure space. A: IEEE European Test Symposium. "Proceedings of the 18th European Test Symposium". Avignon: 2013, p. 70-75.