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dc.contributor.authorSantos Hernández, Sergio
dc.contributor.authorBarcons Xixons, Víctor
dc.contributor.authorChristenson, Hugo K.
dc.contributor.authorBillingsley, Daniel J.
dc.contributor.authorBonass, William A.
dc.contributor.authorFont Teixidó, Josep
dc.contributor.authorThomson, Neil H.
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
dc.date.accessioned2013-10-03T17:28:18Z
dc.date.available2013-10-03T17:28:18Z
dc.date.created2013
dc.date.issued2013
dc.identifier.citationSantos , S. [et al.]. Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging. "Applied physics letters", 2013, vol. 103, núm. 6, p. 1-4.
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/2117/20287
dc.description.abstractA way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 h). In small amplitude smal l set-point (SASS) imaging, the cantilever oscillates with sub-nanometer am plitudes in the proximity of the sample, without the requirement of using large drive forces, a s the dynamics smoothly lead the tip to the surface through the water layer. SASS is demonstrat ed on single molecules of double-stranded DNA in ambient conditions where sharp silicon tips (R 2–5 nm) can resolve the right-handed double helix
dc.format.extent4 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria química::Biotecnologia
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshAtomic force microscopy
dc.subject.lcshMolecular biology
dc.subject.lcshModulation (Electronics)
dc.subject.otherAmplitude modulation Atomic force microscopy
dc.titleStability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging
dc.typeArticle
dc.subject.lemacMicroscòpia de força atòmica
dc.subject.lemacBiologia molecular
dc.subject.lemacModulació (Electrònica)
dc.contributor.groupUniversitat Politècnica de Catalunya. CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació
dc.identifier.doi10.1063/1.4817906
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://apl.aip.org/resource/1/applab/v103/i6/p063702_s1
dc.rights.accessOpen Access
local.identifier.drac12775730
dc.description.versionPostprint (published version)
local.citation.authorSantos , S.; Barcons, V.; Christenson, H.K.; Billingsley, D.J.; Bonass, W.A.; Font, J.; Thomson, N.
local.citation.publicationNameApplied physics letters
local.citation.volume103
local.citation.number6
local.citation.startingPage1
local.citation.endingPage4


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