PublisherInstitute of Electrical and Electronics Engineers (IEEE)
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Thanks to the inherent redundancy to generate
the different output voltage levels, the multilevel active-clamped (MAC) topology presents an important fault-tolerance ability
which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered,
and the analysis is carried out under single-device and two simultaneous device faults. Switching strategies and different
hardware modifications to overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC
prototype are presented to validate the analysis.
CitationNicolas, J. [et al.]. Analysis of the fault-tolerance capacity of the multilevel active-clamped converter. "IEEE transactions on industrial electronics", 2013, vol. 60, núm. 11, p. 4773-4783.
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