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Recent studies have shown that the aging of integrated
circuits may modify electromagnetic emission significantly. This
paper reports on an experiment to elucidate the origins of emis-
sion level changes in a test chip using 90-nm CMOS technology.
Circuit analysis, combined with electromagnetic emission and on-
chip power supply voltage bounce measurements made during the
application of electric stress, have identified the role of intrinsic
wear-out mechanisms, which contribute to a progressive change in
the transient current produced by the circuit.
CitationBoyer, A. [et al.]. Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits. "IEEE transactions on electromagnetic compatibility", 18 Juliol 2013, p. 1-7.
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