On the use of static temperature measurements as process variation observable
Rights accessRestricted access - publisher's policy
In this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, thus reducing test cost and improving built-in capabilities of thermal monitoring. The feasibility of the technique and a complete test methodology is presented using a narrowband LNA as example. Finally, a complete electro-thermal co-simulation test bench between the LNA and a differential temperature sensor embedded in the same silicon die is presented in order to validate the results. Results prove that RF figures of merit can be extracted from DC temperature measurements done without loading or exciting the RF circuit under test.
CitationGómez, D.; Altet, J.; Mateo, D. On the use of static temperature measurements as process variation observable. "Journal of electronic testing. Theory and applications", Octubre 2012, vol. 28, núm. 5, p. 685-695.
|10.1007_s10836-012-5298-z.pdf||On the Use of Static Temperature Measurements as Process Variation Observable||561.8Kb||Restricted access|