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DC temperature measurements for power gain monitoring in RF power amplifiers
| dc.contributor.author | Altet Sanahujes, Josep |
| dc.contributor.author | Mateo Peña, Diego |
| dc.contributor.author | Gómez Salinas, Dídac |
| dc.contributor.author | Perpiñà, Xavier |
| dc.contributor.author | Jordà, Xavier |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2013-02-18T13:32:14Z |
| dc.date.created | 2012 |
| dc.date.issued | 2012 |
| dc.identifier.citation | Altet, J. [et al.]. DC temperature measurements for power gain monitoring in RF power amplifiers. A: IEEE International Test Conference. "2012 IEEE International Test Conference (ITC)". Anaheim, CA: IEEE, 2012, p. 1-8. |
| dc.identifier.isbn | 978-1-4577-0152-8/ |
| dc.identifier.uri | http://hdl.handle.net/2117/17832 |
| dc.description.abstract | In this paper we demonstrate that the steady state temperature increase due to the power dissipated by the circuit under test can be used as observable to test the gain of a 2GHz linear class A Power Amplifier. As a proof of concept, we use two strategies to monitor the temperature: a temperature sensor embedded within the same silicon die, which can be used for a BIST approach, and an Infra Red camera, with applications to failure analysis and product debugging. |
| dc.format.extent | 8 p. |
| dc.language.iso | eng |
| dc.publisher | IEEE |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
| dc.subject.lcsh | Power amplifiers |
| dc.title | DC temperature measurements for power gain monitoring in RF power amplifiers |
| dc.type | Conference report |
| dc.subject.lemac | Amplificadors de potència |
| dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
| dc.identifier.doi | 10.1109/TEST.2012.6401589 |
| dc.description.peerreviewed | Peer Reviewed |
| dc.relation.publisherversion | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6401589&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6401589 |
| dc.rights.access | Restricted access - publisher's policy |
| local.identifier.drac | 11146560 |
| dc.description.version | Postprint (published version) |
| dc.date.lift | 10000-01-01 |
| local.citation.author | Altet, J.; Mateo, D.; Gómez, D.; Perpiñà, X.; Jordà, X. |
| local.citation.contributor | IEEE International Test Conference |
| local.citation.pubplace | Anaheim, CA |
| local.citation.publicationName | 2012 IEEE International Test Conference (ITC) |
| local.citation.startingPage | 1 |
| local.citation.endingPage | 8 |