The direct power injection (DPI) test defined in
IEC 62132-4 measures the conducted immunity of integrated
circuits (ICs) up to 1 GHz. As the frequency of functional and
interference signals is increasing, we would like to characterise
immunity for higher frequencies as well.
In this paper, we show why typical IEC 62132-4 compliant
DPI set-ups become inaccurate when going up to 20 GHz. We
propose to determine the power Ptrans actually transmitted to
the device under test (DUT) by using offline short-open-load-thru
(SOLT) or thru-reflect-line (TRL) calibration. Furthermore, we
design a low-cost FR4 printed circuit board (PCB) that allows
for testing of SOIC8-packaged ICs. We verify that this board
has acceptable and reproducible losses up to 20 GHz, as well as
CitationLand, S. [et al.]. Design of a 20 GHz DPI method for SOIC8. A: European Symposium on Electromagnetic Compatibility. "Proceedings EMC Europe 2012". Roma: 2012.
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder. If you wish to make any use of the work not provided for in the law, please contact: email@example.com